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Micron dimension conversion target device for electron beam emittance measurement

A technology for electron beam emission and target conversion, which is applied in measuring devices, radiation measurement, X/γ/cosmic radiation measurement, etc. It can solve the problems of difficult processing of quartz thin slices, unsatisfactory electron beam emittance measurement, etc., and achieve cost Low, easy maintenance, overcome the effect of small size

Active Publication Date: 2017-07-14
INST OF FLUID PHYSICS CHINA ACAD OF ENG PHYSICS
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Problems solved by technology

[0004] The purpose of the present invention is to provide a micron-scale conversion target device for electron beam emittance measurement, which solves the problem in the prior art that quartz thin slices are difficult to process when the thickness is less than 0.1 mm, and the performance does not meet the requirements of electron beam emittance measurement. Satisfy the use and at the same time have the effect of easy use and convenient maintenance

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  • Micron dimension conversion target device for electron beam emittance measurement

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Embodiment

[0024] Such as figure 1 As shown, the present invention is a micron-scale conversion target device for electron beam emittance measurement, including a lower ring seat 2, the lower ring seat 2 is an annular structure with a groove, the outer diameter of the groove is 92.2mm, The inner diameter is 73.9mm, and the depth is 9mm. The bottom of the annular groove of the lower ring seat 2 is placed with a compression seal ring 3, and the top of the lower ring seat 2 has a semicircular groove with a radius of 2mm for holding the seal ring 4. The upper ring seat 1 is Ring structure with convex ring. The outer diameter of the convex ring is 92mm, the inner diameter is 75mm, and the depth is 7mm. There is a sealing groove in the inner diameter direction of the convex ring of the upper ring seat 1 for placing the side expansion sealing ring 5. The outer diameter of the sealing groove is 79mm, and the width is 79mm. 3.2mm, the difference between the outer diameter of the extended sealing ...

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Abstract

The invention discloses a micron dimension conversion target device for electron beam emittance measurement. The micron dimension conversion target device includes a lower circular seat, the upper end face of the lower circular seat forms a circular groove by recessing inward along the axis and further includes an upper circular seat matched with the lower circular seat, the lower surface of the upper circular seat is provided with a protruding ring protruding downwards and matched with the circular groove of the lower circular seat, and after the protruding ring of the upper circular seat is inserted into the circular groove of the lower circular seat, the film paved on the lower circular seat is expanded to form a minute surface. The micron dimension conversion target device overcomes the defects that a quartz slice is small in size, inconvenient to clean, easy to damage, and inconvenient to install, achieves the aims of simple use, convenient maintaining, and low cost, has the same measurement precision in the various calibers having the diameter ranging from 30-200mm, and greatly improves the adaptive caliber relative to the quartz slice only allowing the diameter of 50-60mm.

Description

technical field [0001] The invention relates to the technical field of electron beam emittance measurement, in particular to a micron-scale conversion target device used for electron beam emittance measurement. Background technique [0002] Electron beam emittance measurement technology in the accelerator field is an important test technology in the accelerator development process. The performance status of the electron beam can be obtained through the measurement of the electron beam emittance, which is of great significance for the debugging of the accelerator. . In the emissivity measurement technology, there is a measurement technology based on the Cerenkov radiation principle, but this measurement technology requires the conversion target thickness to be extremely thin, preferably on the order of microns, and requires the conversion target plane to achieve a mirror effect. Otherwise, it will bring great errors to the measurement and even untrue measurement results. ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01T1/29
CPCG01T1/29
Inventor 李洪江孝国龙全红刘云龙叶毅戴文华王远杨兴林
Owner INST OF FLUID PHYSICS CHINA ACAD OF ENG PHYSICS
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