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Fully-automatic measurement method of plant heights of crops and device

A measurement method and crop technology, applied in the field of automated measurement and non-contact crop structure information, can solve problems such as unconsidered application scenarios

Active Publication Date: 2017-06-20
HUAIYIN INSTITUTE OF TECHNOLOGY
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, in crop height measurement, it is necessary to determine the height of the plant height relative to the growth level. The current structured light measurement system does not consider this application scenario in the modeling or calibration process, so it is not suitable for directly measuring the crop height

Method used

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  • Fully-automatic measurement method of plant heights of crops and device

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Embodiment Construction

[0039] A fully automatic crop height measuring method and device specific implementations of the present invention will be further described below in conjunction with the accompanying drawings in the embodiments of the present application. Apparently, the described embodiments are only some of the embodiments of the present application, not all of them. Based on the embodiments of the present application, all other embodiments obtained by those skilled in the art without creative efforts fall within the protection scope of the present application.

[0040] The basic idea of ​​the present invention is: to measure the height of the crops, that is to determine the distance from the high point of the top of the crops to the horizontal plane corresponding to the starting point of the bottom of the crops. According to the characteristics that the structured light vision sensing system can measure three-dimensional information, combined with the specific application background of cro...

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Abstract

The invention discloses a fully-automatic measurement method of plant heights of crops and a device. The method comprises steps of firstly establishing a camera coordinate system, a ground coordinate system and a calibration board plane coordinate system; after establishing a system model, calibrating device parameters in advance, wherein the device parameters comprise inner parameters of a camera, installation parameters of the camera and linear laser plane parameters; acquiring images, and transmitting the acquired images to a control processor through the camera, wherein the control processor controls on and off of a linear laser and processes the images; and according to image processing results and the device parameters, calculating and outputting the plant heights of the crops through the control processor. According to the invention, manual measurement is not required, so subjective factor effects caused by manual measurement are avoided; and non-contact and automatic measurement of the plant heights of the crops can be simply and easily achieved.

Description

technical field [0001] The invention relates to the field of non-contact and automatic measurement of crop structure information, in particular to a fully automatic method and device for measuring plant height of crops. Background technique [0002] Through the observation of crop growth parameters, identify the impact of agrometeorological conditions on crop growth and development, yield formation and quality, provide basis for agrometeorological information, forecast, crop climate evaluation, and guide field management, etc., and provide high-yield, high-quality, efficient, and precision agriculture. Provide services. Crop growth parameters mainly include density, leaf surface index, plant height, growth, etc., wherein the plant height parameter is an important parameter in the process of crop growth, mainly relying on manual observation, such as the device disclosed in Chinese patent CN204007409 U, which still requires manual use of the device However, manual observation...

Claims

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Application Information

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IPC IPC(8): G01B11/06
CPCG01B11/0608
Inventor 郭新年柯永斌王楷赵正敏付成芳郑凯苏军
Owner HUAIYIN INSTITUTE OF TECHNOLOGY
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