Time-variant reliability sensitivity analysis method and device
A technique for sensitivity analysis and reliability, used in special data processing applications, instruments, electrical digital data processing, etc.
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Embodiment 1
[0066] figure 1 It is a schematic flow chart of the time-varying reliability sensitivity analysis method provided according to Embodiment 1, such as figure 1 As shown, this embodiment provides a time-varying reliability sensitivity analysis method, which is based on a long-period degraded motion mechanism, including:
[0067] Step 101, perform n-order PCE calculation on the motion mechanism to obtain the n-th-order MRF and n-th-order PCE function formula of the motion mechanism, where n is a positive integer greater than 1.
[0068] Specifically, n-order chaotic polynomial expansions (Polynomial chao expansions, referred to as PCE) operations are performed on the motion mechanism to obtain the maximum resistance force of the n-th order resistance of the motion mechanism (Maximum resistance force, referred to as MRF) and the n-th order PCE function formula, the n-th order The first-order PCE function is a relationship between the dependent variable and the independent variable...
Embodiment 2
[0078] This embodiment is a supplementary description based on the first embodiment.
[0079] figure 2 It is a schematic flow chart of the time-varying reliability sensitivity analysis method provided according to Embodiment 2, such as figure 2 As shown, this embodiment provides a time-varying reliability sensitivity analysis method, which is based on a long-period degraded motion mechanism, including:
[0080] Step 201, obtaining degenerate design parameters, wherein the degenerate design parameters are design parameters with a wear-out failure mechanism in the motion mechanism and whose nominal values change with time;
[0081] Specifically, step 201 specifically includes:
[0082] Obtain the failure mode and failure mechanism with the highest risk level of the motion mechanism; establish a failure model according to the failure mode and failure mechanism; calculate and obtain degenerated design parameters according to the failure model.
[0083] Specifically, it is f...
Embodiment 3
[0150] The time-varying reliability sensitivity analysis device provided in this embodiment is used to implement the time-varying reliability sensitivity analysis method in the first embodiment above.
[0151] Figure 6 It is a schematic structural diagram of a time-varying reliability sensitivity analysis device according to Embodiment 3 of the present invention, as Figure 6 As shown, this embodiment provides a time-varying reliability sensitivity analysis device, including: a first acquisition module 301 , a second acquisition module 302 , a judgment module 303 and a third acquisition module 304 .
[0152] Among them, the first acquisition module 301 is used to perform n-order chaotic polynomial expansion PCE operation on the motion mechanism, and obtain the maximum value MRF of the resistance of the n-th order of the motion mechanism and the n-th order PCE functional formula, wherein n is a positive value greater than 1 integer.
[0153] The second acquiring module 302 i...
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