Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Intelligent appearance defect high-speed detection machine

A detection machine and detection mechanism technology, applied in sorting and other directions, can solve the problems of high price, complex structure, low efficiency, etc., and achieve the effects of timely feeding, high coding position accuracy, and ensuring high speed and accuracy.

Active Publication Date: 2016-08-03
肇庆市宏华电子科技有限公司
View PDF8 Cites 21 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0006] In order to solve the problems of low efficiency, high price and complicated structure in the existing technology appearance inspection machine, the present invention proposes an intelligent appearance defect high-speed inspection machine with high efficiency, high detection accuracy and reliable performance

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Intelligent appearance defect high-speed detection machine
  • Intelligent appearance defect high-speed detection machine
  • Intelligent appearance defect high-speed detection machine

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0048] figure 1 It is a top view diagram of an intelligent high-speed defect detection machine of the present invention, which is provided with a feeding mechanism, a material guiding mechanism, a transparent turntable conveying mechanism, a detecting mechanism, a sorting mechanism and a control system. The feeding mechanism includes a feeder, a disc feeder, a linear feeder and a feeder. It is also equipped with a material detection sensor that can control the feeding of the feeder. The linear feeder is provided with a return port connected to the feeder. The outlet of the device is connected to the disc feeder, see figure 2 , 3 shown.

[0049] The transparent turntable conveying mechanism is composed of a servo drive system, a coupling, a bearing mount, and a high-transparency transparent glass turntable, see Figure 4 shown. The detection mechanism includes a position detection unit, a high-speed CCD camera unit, a focus adjustment lens, and an ultra-high-brightness lig...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention relates to the field of manufacturing and detecting of electronic components, in particular to an intelligent appearance defect high-speed detection machine. The intelligent appearance defect high-speed detection machine comprises a feeding mechanism, a guiding mechanism, a transparent rotary disc conveying mechanism, a detecting mechanism, a sorting mechanism and a control system which are sequentially arranged. The feeding mechanism is provided with a material supplementary device, a disc feeder, a linear feeder and a material return device and further provided with a material detection sensor capable of controlling material supplementation of the material supplementary device. The transparent rotary disc conveying mechanism is composed of a servo drive system, a coupling, a bearing mounting base and a high-light-transmittance transparent glass rotary disc. The detection mechanism comprises a position detection unit, high-speed CCD camera shooting units, a focusing adjustment lens and ultrahigh-brightness light source illumination units. The six high-speed CCD camera shooting units and the six ultrahigh-brightness light source illumination units are arranged. The material supplementary device and the material return device of the feeding mechanism achieve timely material supplementation, and detection efficiency is improved. Dual light sources are used for being matched with the high-speed CCD camera shooting units and the focusing adjustment lens, images are clear, the shooting speed, the conveying speed and the judgment speed are increased, and detection precision is improved.

Description

technical field [0001] The invention relates to the field of electronic component manufacturing and testing equipment, and specifically refers to an intelligent high-speed detection machine for appearance defects that realizes chip electronic component feeding, transportation, appearance inspection, image processing, and sorting at ultra-high speed. Background technique [0002] The successful implementation of China's reform and opening policy has greatly promoted the rapid development of the economy, the country has become increasingly prosperous, the people's living standards have improved rapidly, and household appliances have entered thousands of households. The core circuit of household appliances is composed of a large number of electronic components, especially the three major chip components such as capacitors, inductors, and resistors. The market demand for these three components is growing at double digits every year. As household appliances have more functions an...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): B07C5/342B07C5/02B07C5/36
CPCB07C5/02B07C5/3422B07C5/365
Inventor 梁耀国吴忻生梁国衡唐宗辉袁鹏谢广裕江玉娟黄健宇莫祥勇
Owner 肇庆市宏华电子科技有限公司
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products