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Detection system and method based on backscatter imaging

A detection system and detection method technology, applied in the field of backscattering, can solve the problems of limited intelligent discrimination ability of the system, high false alarm rate and false negative rate, and achieve the effect of improving the material resolution ability

Active Publication Date: 2019-03-08
NUCTECH CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] With the increasing demand for intelligent inspection systems, the ability of intelligent identification of systems without material resolution is too limited, and the rate of false positives and false negatives is too high

Method used

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  • Detection system and method based on backscatter imaging
  • Detection system and method based on backscatter imaging
  • Detection system and method based on backscatter imaging

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Embodiment Construction

[0051] Various exemplary embodiments of the present invention will now be described in detail with reference to the accompanying drawings. It should be noted that the relative arrangements of components and steps, numerical expressions and numerical values ​​set forth in these embodiments do not limit the scope of the present invention unless specifically stated otherwise.

[0052] At the same time, it should be understood that, for the convenience of description, the sizes of the various parts shown in the drawings are not drawn according to the actual proportional relationship.

[0053] The following description of at least one exemplary embodiment is merely illustrative in nature and in no way taken as limiting the invention, its application or uses.

[0054] Techniques, methods and devices known to those of ordinary skill in the relevant art may not be discussed in detail, but where appropriate, such techniques, methods and devices should be considered part of the Authoriz...

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Abstract

The invention discloses a detection system and method based on backscattering imaging, and relates to the technical field of backscattering. The detection system based on backscatter imaging includes a radiation source, which is used to send radiation to the object to be inspected; a multi-energy backscatter detector, which is used to receive radiation scattered by the object to be inspected, and output radiation signals; The source is connected with the multi-energy backscatter detector, and is used for receiving the ray signal from the multi-energy back-scatter detector, and processing the ray signal to obtain an image of the inspected object. Based on the fact that the material of the object to be inspected has different physical effects on rays of different energies, the invention can more accurately identify the density, atomic number and image of the object to be inspected, and improves the material resolution capability of the inspection system.

Description

technical field [0001] The invention relates to the technical field of backscattering, in particular to a detection system and method based on backscattering imaging. Background technique [0002] In recent years, with the international community's emphasis on public safety, X-ray backscattering technology has also achieved considerable development. X-ray transmission technology can see through the object to be inspected, but its ability to distinguish low atomic number materials is poor, especially a small amount of light and thin organic substances, such as drugs and thin explosives, cannot be well presented. Although the penetration ability of X-ray backscattering technology is not as good as that of transmission, it is very sensitive to substances with low atomic number, and can highlight dangerous goods such as explosives and drugs. In addition, the green channel on the expressway also uses backscattering technology to intelligently inspect agricultural products, avoid...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01V5/00
CPCG01V5/0025G01V5/0041G01N23/203G01N2223/423
Inventor 李元景李明亮李荐民陈旻雁
Owner NUCTECH CO LTD
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