Method for evaluating opto-coupler storage life based on low-frequency noise classification

Abstract

A method for evaluating the opto-coupler storage life based on low-frequency noise classification comprises the following steps that firstly, a low-frequency noise adapter is arranged according to the inner structure of each opto-coupler; secondly, original low-frequency noise of each opto-coupler is measured; thirdly, samples are classified according to the low-frequency noise; fourthly, the temperature of a accelerated life test is determined and the accelerated life test is conducted on the samples in a classified mode; fifthly, a function of a degeneration trend is determined; sixth, the opto-coupler storage life at the normal temperature is extrapolated through a high-temperature storage result. According to the method for evaluating the opto-coupler storage life based on low-frequency noise classification, the opto-couplers of the same batch are classified, service life evaluation is respectively conducted on the opto-couplers, a thought allowing the service lives of the opto-couplers to be ranked and classified before the accelerated life test is conducted is provided, an effective way is offered for the current research in the aspect of storage life evaluation of a semiconductor circuit, the opto-couplers with the similar service life are in the same classification, and therefore the accuracy of opto-coupler service life evaluation is improved.

Description

Technical field [0001] The invention provides a method for evaluating the storage life of an optocoupler based on the classification of low-frequency noise. The method divides the optocoupler into three types by low-frequency noise, and evaluates the life of the three types of optocouplers respectively. Use low-frequency noise to reflect the characteristics of the optocoupler itself, divide the optocouplers into three types with different degrees of defect, and observe the CTR of the optocouplers with different degrees of defects at different temperatures (Current Transfer Ratio is the current transfer ratio of the optocoupler) Degradation data. The lifetimes of the three types of devices are obtained by fitting the degradation data. It is found that the lifetimes of similar devices at the same temperature are closer, and the greater the degree of defects at the same temperature, the shorter the lifetime. Background technique [0002] Optocoupler is a general term for devices th...

AI Technical Summary

Problems solved by technology

The defect of the device itself will cause the increase of 1 / f noise and generation-recombination noise (g-r noise) of the device, and also cause parameter depletion and shorten the service life of the device

Although each device has thermal noise, shot noise and 1 / f noise, when there are lattice dislocations in the device, heavy metal impurity agglomeration near the pn junction, gas adsorption on the device surface, positrons in the Si-SiO2 layer, When there are defects such as impurity traps, the actual noise will increase

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