Multi-port S parameter test device based on USB interface

Abstract

The invention belongs to the signal test technology field and related to a multi-port S parameter test device based on a USB interface. The multi-port S parameter test device comprises a USB interface module, a source switch array, a reception switch array and a coupler array, wherein the USB interface module is respectively connected with the source switch array and the reception switch array, and the source switch array and the reception switch array are respectively connected with the coupler array. According to the multi-port S parameter test device, a two-port network analyzer which is taken as a host can be expanded into a multi-port network analyzer while cost is quite low, the multi-port S parameter test device can be used for measuring various multi-port, multi-function assemblies and modules and has advantages of simple structure and high stability.

Description

technical field [0001] The invention relates to a port parameter testing technology, in particular to a multi-port S parameter testing device based on a USB interface, which belongs to the technical field of signal testing. Background technique [0002] At present, multi-channel beam power combining and multi-channel coherent receiving technologies are important features of modern electronic technology. As the requirements for transmitting output power and receiving sensitivity become higher and higher, the number and scale of channels show a trend of rapid growth. Ten channels grow to hundreds or thousands of channels. Changes in the equipment system and structural system have prompted changes in products at all levels of the electronic technology industry, and various multi-port, multi-functional components and modules have emerged, such as power combining networks, T / R units composed of multiple T / R components, Various feeder networks, etc., and have the remarkable featu...

AI Technical Summary

Problems solved by technology

Although it can expand the ports of the two-port vector network analyzer, the focus of this application is that two or more users can use one vector network analyzer at the same time, but it cannot complete all S of the multi-port DUT. Parameter testing can not overcome the other defects mentioned above

[0005] In the prior art, the multi-port network analyzer that completes all S-parameter tests of multi-port devices still has a way of using a four-port vector network analyzer as the host, although its measurement efficiency and connection are more complicated than that of a two-port vector network analyzer The performance has been greatly improved, but the problem is that most of the vector network analyzers owned by users currently have two ports, and the cost of purchasing four-port network analyzers and multi-port expansion devices is relatively high, and it causes a waste of resources.

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