Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Method for extracting 0-1 topological graph of compliant mechanism

A technology of compliant mechanisms and extraction methods, applied in special data processing applications, instruments, electrical digital data processing, etc., can solve problems such as poor continuity of sensitivity, inability to accurately evaluate the sensitivity of material units, and units that can no longer be used

Active Publication Date: 2013-04-17
SOUTH CHINA UNIV OF TECH
View PDF3 Cites 6 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

It obtains the optimal solution by gradually removing invalid materials. Its advantage is that it does not need to introduce too many mathematical theories. However, since this method belongs to the category of integer programming, the continuity of sensitivity is poor, and the removed units cannot be used again. Therefore, Calculation efficiency is low, and it is easy to cause the result to not converge
On this basis, a two-way progressive method was developed. This method aims to remove invalid materials while adding effective materials to improve the convergence effect. However, this method is still an integer programming in essence, and cannot accurately evaluate all Sensitivity of Added Material Elements
In addition, there are methods combining simulated annealing and SIMP, and unit connection parameterization methods. Judging from their optimization results, it is still impossible to extract the ideal 0-1 topology.
Moreover, the above methods have the common disadvantage of easily leading to checkerboard
[0008] In addition, the topology optimization method based on level set is also an effective method to solve the problem of intermediate units, but this method also has defects such as initial sensitivity, inability to generate new holes, low computational efficiency, and difficulty in converging to non-smooth corners. Although some improved methods have been proposed, these problems have not been fully resolved

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Method for extracting 0-1 topological graph of compliant mechanism
  • Method for extracting 0-1 topological graph of compliant mechanism
  • Method for extracting 0-1 topological graph of compliant mechanism

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0077] The purpose of the present invention will be further described in detail below in conjunction with the accompanying drawings and specific embodiments, and the embodiments cannot be repeated here one by one, but the implementation of the present invention is not therefore limited to the following embodiments. Unless otherwise specified, the materials and processing methods used in the present invention are conventional materials and processing methods in the technical field.

[0078] like figure 1 As shown in the figure, it is a flow chart of a method for extracting a compliant mechanism 0-1 topological map proposed by the present invention.

[0079] The embodiment of the present invention is a typical compliant force-displacement reverse mechanism, and its design domain and boundary conditions are as follows figure 2 shown. where the design domain size is , the elastic modulus and Poisson's ratio of the material are respectively and , and are load input poi...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a method for extracting a 0-1 topological graph of a compliant mechanism. By continuously reducing an available material domain of a topological optimization model, the optimal solution is gradually approached, and the ideal 0-1 topological graph of the compliant mechanism is finally extracted. The method can effectively solve the problem of temporary location in loosening of a design variable based on an SIMP method. Completely different from a traditional progressive topological optimization method, the method has the advantages that design variables are continuous, sensitivity and continuity are fine, the conception is simple, the method is easily executed, checkerboards are not easily caused, the defects of parameter sensitivity and mesh dependency of a traditional method are overcome, and the method has fine convergence stability.

Description

technical field [0001] The invention relates to the technical field of topology map extraction in the topology optimization design of a compliant mechanism, in particular to a method for extracting a 0-1 topology map of a compliant mechanism. Background technique [0002] With the rapid development of microelectromechanical systems, micromachining and micromanipulation, and new materials, the design of compliant mechanisms has become a research hotspot in the field of mechanism science at home and abroad. [0003] Using the topology optimization method to study the design of the compliant mechanism only needs to give the design domain and specify the input and output positions, and does not need to start from a known rigid mechanism, and the obtained mechanism has the superior performance of distributed flexibility, which has attracted great attention. . [0004] This method is usually based on finite element analysis. In the initial stage of topology optimization, the desi...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): G06F17/50
Inventor 付永清张宪民
Owner SOUTH CHINA UNIV OF TECH
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products