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Method and device for measuring flatness of backplane of liquid crystal display device

A liquid crystal display device and flatness technology, which can be applied to measurement devices, instruments, etc., can solve problems such as poor quality and deviation of liquid crystal display devices, and achieve the effect of avoiding unqualified liquid crystal display devices from leaving the factory.

Active Publication Date: 2015-10-14
GOERTEK INC
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] The invention provides a method and device for measuring the flatness of the backplane of a liquid crystal display device, so as to solve the problem that the quality of the liquid crystal display device is poor due to the deviation between the real shape of the backplane and the detection data

Method used

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  • Method and device for measuring flatness of backplane of liquid crystal display device
  • Method and device for measuring flatness of backplane of liquid crystal display device
  • Method and device for measuring flatness of backplane of liquid crystal display device

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Embodiment

[0060] Examples of the present invention are Figures 2 to 5 shown. The steps of embodiment method are as Image 6 shown.

[0061] In step S601 , the backplane 200 to be tested is supported on the test platform 400 by the block 300 .

[0062] In this embodiment, the test platform 400 is a grade A or AA marble platform, and there are four spacers 300, and the height difference between them is less than 0.05 mm. Such as figure 2 As shown, adjust the position of the spacer 300 so that it is at the four corners of the backboard 200 , and place the backplane 200 flat on the plane formed by the spacer 300 . The schematic diagram of the supporting position of the cushion block 300 in the backplane 200 in this embodiment is as follows image 3 shown.

[0063] Step S602, arrange measurement points on the surface of the backplane 200, and select a reference point 0.

[0064] The measurement points are included in the support positions of the pads 300 of the backplane 200 . The ...

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Abstract

The invention discloses a method and a device for measuring backboard planeness of a liquid crystal display device. The method comprises the steps of: supporting a backboard to be tested on a testing platform through a cushion block; figuring out a virtual plane closest to the supporting position of the cushion block, and taking the virtual plane as a reference plane; and calculating the height of a measuring point of the background relative to the reference plane according to a height measured by a height gage to obtain the planeness of the backboard. The method disclosed by the invention can solve the problem of unfavorable quality of the liquid crystal display device caused by deviation of real shape of the backboard and the detection data.

Description

technical field [0001] The invention relates to the field of liquid crystal display, in particular to a method and a device for measuring the flatness of a back plate of a liquid crystal display device. Background technique [0002] The backplane is a key component in the liquid crystal display device, and the state of the backplane largely determines the quality of the liquid crystal display device after assembly. At present, the production process of backplane is mainly cold stamping. The stamping production process of the back plate causes different degrees of flatness deformation after forming. The current measurement method for detecting deformation is affected by the measurement operator, the pressure of the contact surface between the measuring tool and the back plate, and the placement state of the back plate. The measured plane There is a big difference between the flatness data and the real flatness result of the product, and the flatness is difficult to control. ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01B21/30
Inventor 张帅谭树民曹永
Owner GOERTEK INC
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