Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

A single-baseline non-cooperative target binocular measurement system

A measurement system and single-baseline technology, which is applied in the directions of measurement devices, photogrammetry/video metrology, surveying and navigation, etc., can solve problems such as unusable, complicated monocular cameras, and no signs, etc., to reduce conditions and reduce sun The effect of stray light interference

Active Publication Date: 2014-10-08
BEIJING INST OF CONTROL ENG
View PDF2 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

In order to make the measurement system cover the measurement range of tens of meters to sub-meters, the current measurement technology in the field of aerospace technology is limited to the measurement of cooperative targets. Active target generators or passive corner reflectors are used as cooperative targets, and monocular cameras can be used. The position measurement of the target relative to 6 degrees of freedom can still meet the measurement requirements for the cooperative target binocular measurement system in principle, but it is more complicated than the monocular camera
[0003] however, for non-cooperative targets, that is, without any pre-installed markers, to achieve the rendezvous and docking mentioned above, it is not possible to use some spatially distributed marker lights or known measurement objects such as reflectors as reference targets
For the rendezvous and docking measurement of non-cooperative targets, in order to make the measurement system cover the measurement range of tens of meters to submeters, aerospace is still exploring in this technical field, and there is no very mature technology

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • A single-baseline non-cooperative target binocular measurement system
  • A single-baseline non-cooperative target binocular measurement system
  • A single-baseline non-cooperative target binocular measurement system

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0032] The measurement method of rendezvous and docking of non-cooperative targets in the ultra-short range adopts the active lighting binocular vision measurement system. Attitude measurement. The binocular vision measurement system generally includes two cameras whose optical axes are installed close to parallel, the design parameters of the two are the same, and the optical axes form a certain angle.

[0033] The present invention proposes a new rendezvous and docking measurement system, which is different from the existing measurement system in that it does not need cooperative measurement targets such as marker lights and reflectors as auxiliary equipment, which can reduce the rendezvous and docking conditions, and is suitable for For rendezvous and docking capture of completely unknown targets, a visual measurement system composed of a pair of binocular cameras can be used at ultra-close distances to identify unknown target features and determine three-dimensional coordi...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a single-baseline non-cooperative target binocular measurement system, which comprises a single-baseline binocular camera, an active lighting system and a data processing computer. The illumination emission angle is greater than or equal to the field angle of a single camera, and the data processing computer processes the imaging of the single baseline binocular camera. The present invention is a non-contact image measurement system for non-cooperative targets. For completely non-cooperative targets or semi-cooperative targets, there is no cooperative measurement object installed on the measured target. The extraction and confirmation measurement of feature points can reduce the conditions for rendezvous and docking, and is suitable for rendezvous, docking and capture with completely unknown targets; the invention uses an active lighting system to illuminate non-cooperative targets to reduce solar stray light interference in the measurement system and Normal operation without external light source.

Description

technical field [0001] The invention relates to a non-cooperative target binocular measurement system, in particular to a single-baseline non-cooperative target binocular measurement system, which belongs to the field of non-contact visual measurement of non-cooperative targets and is applicable to the movement of non-cooperative spacecraft in the autonomous approach process The relative measurement of parameters can also be used for the relative measurement of motion parameters of non-cooperative targets on the ground at ultra-short distance. Background technique [0002] In autonomous spacecraft rendezvous and docking missions, optical imaging sensors are currently used internationally to measure the relative position and attitude of targets within a distance of tens of meters before docking. Therefore, it is necessary to install marker lights or reflectors on the target spacecraft, install measuring equipment on the rendezvous spacecraft to measure them, establish the tar...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): G01C11/00G01C11/04
Inventor 郝云彩张弘贾瑞明何英姿魏春岭
Owner BEIJING INST OF CONTROL ENG
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products