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Storage device testing system cooling

A technology of storage equipment and testing system, which is applied in the field of cooling and can solve problems such as cooler condensation

Active Publication Date: 2012-05-23
TERADYNE
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

In addition, coolers may form condensation when operating below the air dew point

Method used

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  • Storage device testing system cooling
  • Storage device testing system cooling
  • Storage device testing system cooling

Examples

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Embodiment Construction

[0087] Temperature regulation of a storage device can be an important factor during storage device testing (eg, validation, quality inspection, functional testing, etc.). One method of performing temperature regulation includes moving air over and / or around the storage device during testing. As will be discussed in detail, each of the volume, temperature and flow path of air moved relative to the storage device during testing is an element in providing reliable, effective and efficient temperature control of the storage device.

[0088]Storage devices as used herein include disk drives, solid state drives, memory devices, and any device that would benefit from asynchronous verification testing. A disk drive is usually a non-volatile storage device that stores digitally encoded data on a rapidly spinning platter with a magnetic surface. A solid-state drive (SSD) is a data storage device that uses solid-state memory to store persistent data. SSDs that use SRAM or DRAM (rather ...

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Abstract

A storage device transporter (800, 800', 1800) includes a transporter body (810, 1810) having first and second body portions (802, 804, 1802, 1804). The first body portion (802, 1802) is configured to be engaged by automated machinery for manipulation of the storage device transporter (800, 800', 1800). The second body portion (804, 1804) is configured to receive and support a storage device. The first body portion (802, 1802) is configured to receive and direct an air flow (305, 1950) over one or more surfaces of a storage device supported in the second body portion.

Description

technical field [0001] The present disclosure relates to cooling in storage device testing systems. Background technique [0002] Storage device manufacturers typically test that the storage devices they manufacture meet a set of requirements. Test equipment and techniques exist for testing large numbers of storage devices serially or in parallel. Manufacturers tend to test a large number of storage devices simultaneously. Storage device testing systems generally include one or more racks having a plurality of test slots that receive storage devices for testing. [0003] During the manufacture of disk drives or other storage devices, the temperature of the storage device is often controlled, for example, to ensure that the storage device functions properly within a predetermined temperature range. For this reason, the test environment in close proximity to the storage device can be varied under program control. In some known test systems, sometimes referred to as "batch ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G11B20/18G11B33/14G01R31/26H01L21/677
CPCG11B33/142G11B33/128G11B20/18G11B33/14G01R31/26
Inventor 布莱恩·S·梅洛尼古拉斯·C·克里科里安
Owner TERADYNE
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