Sample inspection device management server, sample inspection device, sample inspection system, and sample inspection method
A technology for managing servers and inspection devices, applied to instruments, analytical materials, etc., which can solve problems such as updates, reduced operating efficiency of operators, and excessive delays in specimen processing
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[0045] Hereinafter, embodiments of the present invention will be described in detail based on the drawings. In addition, in all the drawings for describing the embodiments, the same members are given the same symbols in principle, and redundant descriptions are omitted.
[0046] In the following description of the present embodiment, a sample inspection method will be described in which, in a situation where a sample inspection system is executing inspections of a plurality of A priority processing request of a subject (hereinafter referred to as a specific subject) is executed while considering a plurality of processing situations.
[0047] In particular, in this embodiment, a case will be described in which priority is assigned to each of a plurality of subjects, and in the subject examination system, an examination is performed according to the priority, and a case is received from a consultation room or an X-ray examination department via a network. ask.
[0048] figure...
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