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Sample inspection device management server, sample inspection device, sample inspection system, and sample inspection method

A technology for managing servers and inspection devices, applied to instruments, analytical materials, etc., which can solve problems such as updates, reduced operating efficiency of operators, and excessive delays in specimen processing

Inactive Publication Date: 2016-01-20
HITACHI HIGH-TECH CORP
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0010] However, in Patent Document 1, it is not possible to update the priority in consideration of the priority and processing progress of the sample processed in parallel with the updating of the priority in the sample inspection system.
Therefore, there is a problem that when the priority of the specific subject is updated, the processing of the subject processed in parallel with the specific subject is excessively delayed.
[0011] Also, it is difficult to provide doctors with an organizational structure for updating priorities assigned to specific subjects in order to reduce such problems.
Therefore, when there is an update request for a specific subject, the doctor has to call the operator to respond, which is one of the main reasons for the decrease in the work efficiency of the operator.

Method used

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  • Sample inspection device management server, sample inspection device, sample inspection system, and sample inspection method
  • Sample inspection device management server, sample inspection device, sample inspection system, and sample inspection method
  • Sample inspection device management server, sample inspection device, sample inspection system, and sample inspection method

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Embodiment Construction

[0045] Hereinafter, embodiments of the present invention will be described in detail based on the drawings. In addition, in all the drawings for describing the embodiments, the same members are given the same symbols in principle, and redundant descriptions are omitted.

[0046] In the following description of the present embodiment, a sample inspection method will be described in which, in a situation where a sample inspection system is executing inspections of a plurality of A priority processing request of a subject (hereinafter referred to as a specific subject) is executed while considering a plurality of processing situations.

[0047] In particular, in this embodiment, a case will be described in which priority is assigned to each of a plurality of subjects, and in the subject examination system, an examination is performed according to the priority, and a case is received from a consultation room or an X-ray examination department via a network. ask.

[0048] figure...

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Abstract

There is provided a sample test system which can execute a prior process for a specific sample in consideration of priorities and process progresses of a plurality of samples processed in the sample test system. The sample test system includes a sample-test-device management server 101, when a specific-sample prior process request containing a specific sample ID and a prior-process-request level identification code is accepted from a sample access system 108, which selects a specific-sample prior-process-policy determination table based on the prior-process-request level identification code attached to the specific-sample prior process request, which determines a specific-sample prior process policy based on the specific-sample prior-process-policy determination table and a process state of the sample, which specifies a sample ID regarding the specific sample ID, and which transmits the specific-sample prior process policy to a sample-test-device group 119.

Description

technical field [0001] The present invention relates to an object inspection device management server, an object inspection system, and an object inspection method, and particularly relates to the use of a preprocessing device that preprocesses an object before inspection and the use of a preprocessed object The processing of the analysis device when the body is analyzed. Background technique [0002] In recent years, examination rooms in hospitals have introduced specimen examination systems consisting of preprocessing devices, analyzers, etc., to speed up examination processing and report examination results to doctors quickly. [0003] In addition, for subjects that have different needs related to speed, such as periodic examinations of inpatients, examinations of outpatients, and examinations of patients during surgery, by assigning priorities to the subjects corresponding to the needs, it is possible to match the needs with each other. The inspection results are prompt...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01N35/00G01N35/02
CPCG01N35/02G01N35/00G01N35/00732G01N35/0092G01N35/0095
Inventor 野口孝史但马庆行鸭志田幸司石井尚实
Owner HITACHI HIGH-TECH CORP
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