A three-dimensional measurement method and system based on epipolar geometry

A technology of epipolar geometry and three-dimensional measurement, applied in the direction of measuring devices, instruments, and optical devices, can solve the problems affecting the accuracy of three-dimensional measurement and the inability to obtain three-dimensional distribution information of objects, and achieve the goal of improving accuracy and speed and large phase sensitivity Effect

Active Publication Date: 2022-08-02
CHANGCHUN INST OF OPTICS FINE MECHANICS & PHYSICS CHINESE ACAD OF SCI
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Problems solved by technology

At the same time, the existing structured light 3D measurement methods are all based on horizontal or vertical gratings for 3D measurement, but for inclined gratings, it is impossible to uniquely determine v p or u p (Projector coordinates), resulting in the inability to directly obtain the three-dimensional distribution information of objects from a single oblique grating projection, which affects the accuracy of three-dimensional measurement

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  • A three-dimensional measurement method and system based on epipolar geometry
  • A three-dimensional measurement method and system based on epipolar geometry
  • A three-dimensional measurement method and system based on epipolar geometry

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[0082] In order to make the objectives, technical solutions and advantages of the present application more clear, the present application will be further described in detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain the present application, but not to limit the present application.

[0083] see figure 1 , is a flow chart of the three-dimensional measurement method based on epipolar geometry according to the embodiment of the present application. The three-dimensional measurement method based on epipolar geometry according to the embodiment of the present application includes the following steps:

[0084] S10: Collect the grating image of the surface of the object to be measured through the structured light system;

[0085] In this step, the structured light system includes a projector and a camera, wherein the projector is used to project gratings with dif...

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Abstract

The present application relates to a three-dimensional measurement method and system based on epipolar geometry. The method includes: collecting a grating image of the surface of the object to be measured through a structured light system; calibrating internal and external parameters of the structured light system by using a calibration method based on a binocular model; substituting the internal and external parameters into a set extremum point solution formula , solve the distribution of extreme points on the camera pixel coordinates, and determine the oblique grating image with the optimal grating angle according to the distribution of the extreme points on the camera pixel coordinates; based on the epipolar geometry method, according to the oblique grating image Calculate the three-dimensional information of the object to be measured. The embodiment of the present application realizes high-precision three-dimensional measurement using a single set of optimally inclined grating images, has maximum phase sensitivity, and greatly improves the accuracy and speed of three-dimensional measurement.

Description

technical field [0001] The present application belongs to the technical field of structured light three-dimensional measurement, and in particular relates to a three-dimensional measurement method and system based on epipolar geometry. Background technique [0002] Structured light 3D measurement is a technology that can obtain the geometric information of the surface of an object without physical connection. It has been widely used in many fields such as biomedicine, industrial manufacturing, computer vision, entertainment and so on. A typical structured light system consists of a projector and a camera, wherein the projector is used to project a specific grating image generated by the computer onto the surface of the object to be measured, and the camera is used to collect the grating image modulated by the surface of the object to be measured. The phase distribution containing the three-dimensional information of the object can be obtained by analyzing the collected grati...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01B11/25
CPCG01B11/2504G01B11/2527
Inventor 吕深圳邓伟杰胡海翔陶小平张志宇张斯特徐萌萌魏鸿达张学军
Owner CHANGCHUN INST OF OPTICS FINE MECHANICS & PHYSICS CHINESE ACAD OF SCI
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