Interval Clustering Method for Component Defect Detection Based on Feature Selection and Combination Optimization Algorithm
A combination optimization and feature selection technology, which is applied to computer parts, calculation, image analysis, etc., can solve the problems of complex combination of setting intervals, not optimal, different optical surfaces, etc.
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[0036] In order to make the technical problems, technical solutions and beneficial effects solved by the present invention clearer, the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain the present invention, not to limit the present invention.
[0037] See Figure 5 with Figure 8 , a feature selection and combined optimization algorithm for component defect detection interval clustering method, the specific steps are as follows:
[0038] The first step, data collection: The equipment machine takes a picture of the workpiece, reads the contour points (pixel coordinates) in the original picture, and completes the data collection work. Among them, the equipment machine can be electronic 3C surface defect appearance inspection equipment. The workpieces are electronic 3C workpieces, such as mobile phone casings, ...
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