Intelligent door lock test circuit and intelligent door lock test device

A technology for smart door locks and test circuits, applied in measuring devices, measuring electricity, measuring electrical variables, etc., can solve problems such as lack of quality testing and performance cannot be guaranteed, and achieve efficient performance testing and improve production quality.

Active Publication Date: 2019-07-23
ZHUHAI GREE INTELLIGENT EQUIP CO LTD +1
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] In view of the above problems, the present invention proposes an intelligent door lock testing circuit and an intelligent door lock testing device, which solves the problem that the performance of the existing intelligent door lock cannot be guaranteed without a special testing device for quality testing after assembly

Method used

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  • Intelligent door lock test circuit and intelligent door lock test device

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Embodiment Construction

[0027] The present invention will be further described below in combination with specific embodiments. Among them, the accompanying drawings are only for illustrative purposes, showing only schematic diagrams, rather than actual drawings, and should not be understood as limitations on this patent; for those skilled in the art, some known structures and their descriptions in the accompanying drawings may be omitted. understandable.

[0028] In the description of the present invention, it should be understood that if the orientation or positional relationship indicated by the terms "upper", "lower", "left", "right", "inner" and "outer" are based on the drawings The orientations or positional relationships shown are only for the convenience of describing the present invention and simplifying the description, and do not indicate or imply that the referred devices or elements must have a specific orientation, be constructed and operated in a specific orientation, so the positional ...

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Abstract

The invention provides an intelligent door lock test circuit and an intelligent door lock test device. The intelligent door lock test circuit comprises a power supply conversion module, an electricaltest module, an emergency power supply test module and a normal power supply test module; the power supply conversion module is used for converting an input voltage into two output voltages, a first output voltage is used for providing a control voltage for the electrical test module, the emergency power supply test module and the normal power supply test module, and a second output voltage is used for performing test power supply, emergency power supply or normal power supply on a to-be-tested intelligent door lock; and the electrical test module, the emergency power supply test module and the normal power supply test module are respectively used for controlling on-off of test power supply, emergency power supply and normal power supply circuits of the to-be-tested intelligent door lock.The intelligent door lock test device comprises the intelligent door lock test circuit. The intelligent door lock test circuit and device provided by the invention can simply and efficiently realize an intelligent door lock performance test.

Description

technical field [0001] The invention relates to the technical field of intelligent testing, in particular to an intelligent door lock testing circuit and an intelligent door lock testing device. Background technique [0002] With the development of smart home technology, the application of smart door locks is becoming more and more extensive. However, there is no special device for testing the smart door lock in the prior art, and the performance cannot be guaranteed. In the existing technology, after the assembly line of the smart door lock is completed, it is impossible to confirm whether there is a problem with the assembly and whether the door lock can be used normally after assembly. This not only affects the quality of the product, but also affects the benefits of the entire company. There are great hidden dangers in the correctness of assembly process and the rationality of product structure and function. [0003] Therefore, in order to eliminate the hidden danger t...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/00
CPCG01R31/00
Inventor 王承富吴继青时夏王伟峰赖志锋马倩
Owner ZHUHAI GREE INTELLIGENT EQUIP CO LTD
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