A residual life evaluation and reliability analysis method for a high-acceleration stress screening test

Abstract

The invention belongs to the technical field of high-acceleration stress screening tests, and discloses a residual life evaluation and reliability analysis method for a high-acceleration stress screening test. The method includes: Performing entity modeling by adopting finite element analysis software; Loading the screening object model according to a damage limit and a working limit in a high acceleration service life (HASS) test; Performing finite element simulation analysis under temperature and vibration stress according to the determined damage limit and working limit to obtain damage factors and equivalent life under different stress levels; carrying out Sorting statistics and analysis on the failure mode and the failure time of the screening object, and selecting a reliability analysis model; Constructing a comprehensive cumulative damage factor under temperature and vibration stress, calculating an equivalent life, obtaining a reliability model under an HASS profile, and carrying out residual life assessment and reliability analysis on the object subjected to the HASS test.

Description

technical field [0001] The invention belongs to the technical field of high-accelerated stress screening tests, and in particular relates to a remaining life evaluation and reliability analysis method of high-accelerated stress screening tests. Background technique [0002] At present, the existing technologies commonly used in the industry are as follows: the reliability of products is designed, manufactured, and managed. Various uncertainties in the manufacturing process of products cause more or less defects and hidden dangers in products, making There are great differences in the reliability of the products produced, so it is necessary to screen the products 100%, so as to eliminate early failures caused by raw materials, bad components, process defects and other reasons, and achieve the purpose of improving product quality and reliability . Highly Accelerated Stress Screening (Highly Accelerated Stress Screening, HASS) adopts comprehensive stress such as temperature cy...

AI Technical Summary

Problems solved by technology

In the section design of HASS and the actual production of products, due to the limitation of technology and funds, the development and further development of HASS have been hindered to a certain extent.

The existing high-accelerated screening test life evaluation test is expensive, and it is difficult to guarantee the accuracy and reliability of the problem

[0003] To sum up, the problems existing in the existing technology are: the existing high-accelerated screening test life evaluation test is expensive, and the accuracy and reliability are low

[0004] The difficulty and significance of solving the above technical problems: For electrical components, it is often difficult to obtain product life data. Traditional methods can only obtain a small amount of sample data, and the cost is high

The resulting lifetime estimates are only approximate and do not give an indication of reliability

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