A method and device for improving the calibration accuracy of measuring equipment based on machine learning

A technology of measuring equipment and calibration accuracy, which is applied in the direction of instruments and complex mathematical operations, etc., can solve problems affecting calibration accuracy, etc., and achieve the effect of improving calibration accuracy, improving calibration accuracy, and reducing the influence of accidental factors

Active Publication Date: 2021-05-18
深圳探科技术有限公司
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Problems solved by technology

[0003] The disadvantage of the existing technology is that the second step always records a reading at one time and uses it as the basis for data fitting and calibration, which has a large chance and affects the calibration accuracy

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  • A method and device for improving the calibration accuracy of measuring equipment based on machine learning
  • A method and device for improving the calibration accuracy of measuring equipment based on machine learning
  • A method and device for improving the calibration accuracy of measuring equipment based on machine learning

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Embodiment Construction

[0023] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain the present invention, not to limit the present invention.

[0024] see figure 1 , figure 1 It is a flowchart of a method for improving the calibration accuracy of a measuring device based on machine learning according to an embodiment of the present invention. The method for improving the calibration accuracy of measuring equipment based on machine learning in the embodiment of the present invention includes:

[0025] Step 100: Estimate the mean a(j) and variance v(j) of the sampled readings according to the technical specifications of the analog devices used by the measuring equipment;

[0026] In step 100, the factory specification of the analog device...

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Abstract

The present invention is a method and device for improving the calibration accuracy of measuring equipment based on machine learning. The method includes: step a: estimating the mean value a(j) and variance v(j) of sampling readings according to the technical specifications of the analog devices used in the measuring equipment , and use the specific voltage U(j) output by the standard source as the calibration voltage; Step b: The equipment to be calibrated samples the voltage input by the standard source multiple times at a certain time interval, and records the readings X(j) of all input voltage samples ,i); Step c: Update the mean value a(j) of the sampling readings and the estimation of the variance v(j) of the sampling readings of the measuring equipment; Step d: For each calibration voltage U(j), obtain the corresponding sampling of the measuring equipment The average value a(j) of the readings is used for data fitting using the obtained average value a(j) of the sampling readings of the measuring equipment, and the fitting result is recorded as the calibration result. The invention can reduce the influence of accidental factors and improve the calibration accuracy.

Description

technical field [0001] The invention relates to the technical field of measuring equipment calibration, in particular to a method and device for improving the calibration accuracy of measuring equipment based on machine learning. Background technique [0002] Measuring equipment needs to be calibrated by standard source equipment before use, and only after calibration can the measured physical quantity be accurately measured. Such as voltage measurement, the current calibration method includes: Step 1: The standard source outputs a specified voltage signal; Step 2: The measuring device to be calibrated measures the voltage signal input by the standard source and records the reading; Step 3: Set the standard The source outputs the next voltage signal and repeat step 2; step 4: after all the calibration voltages are measured, use the linear regression algorithm to do data fitting, and the fitting process uses the least square algorithm; step 5: for the recorded data After the...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01D18/00G06F17/18
CPCG01D18/00G06F17/18
Inventor 李五文
Owner 深圳探科技术有限公司
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