Method and device for measuring amplitude-frequency characteristics of electro-optic intensity modulator based on optical sampling

A technology of electro-optical intensity modulation and amplitude-frequency characteristics, which is used in measurement devices, optical instrument testing, and optical performance testing.

Inactive Publication Date: 2020-05-01
UNIV OF ELECTRONICS SCI & TECH OF CHINA
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  • Abstract
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Problems solved by technology

[0005] To sum up, the current existing solutions for measuring the amplitude-frequency response of intensity modulators based on electric spectrum analysis have the following problems: additional calibration of detectors is required, broadband detectors and measuring instruments are required, and the number of broadband microwave signal sources needs to be increased

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  • Method and device for measuring amplitude-frequency characteristics of electro-optic intensity modulator based on optical sampling
  • Method and device for measuring amplitude-frequency characteristics of electro-optic intensity modulator based on optical sampling
  • Method and device for measuring amplitude-frequency characteristics of electro-optic intensity modulator based on optical sampling

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Embodiment Construction

[0023] Embodiments of the present invention are described below through specific examples, and those skilled in the art can easily understand other advantages and effects of the present invention from the content disclosed in this specification. The present invention can also be implemented or applied through other different specific implementation modes, and various modifications or changes can be made to the details in this specification based on different viewpoints and applications without departing from the spirit of the present invention.

[0024] Such as figure 1 As shown, a device for measuring the amplitude-frequency characteristics of electro-optical intensity modulators based on optical sampling includes a mode-locked laser 1, an electro-optic intensity modulator to be tested 2, a microwave signal source 3, a DC voltage source 4, a low-frequency photodetector 5, and a spectrum Analyzer 6, computer 7;

[0025]The output port of the mode-locked laser 1 is connected t...

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Abstract

The invention provides a device and method for measuring amplitude-frequency characteristics of an electro-optic intensity modulator based on optical sampling, including a mode-locked laser, an electro-optic intensity modulator to be tested, a microwave signal source, a DC voltage source, a low-frequency photodetector, a spectrum analyzer, Computer; the invention uses low-speed optical down-conversion sampling to realize the amplitude-frequency response measurement of the broadband electro-optical intensity modulator. Since the optical down-conversion sampling has the characteristics of low sampling rate, large analog bandwidth and high precision, the measurement system has low-frequency detection and no calibration is required. Advantages of photoelectric detectors; and compared with existing low-frequency detection methods, this measurement system only uses a single microwave signal source, and has a simple structure and low cost.

Description

technical field [0001] The invention relates to the field of optoelectronic technology, in particular to a method and device for measuring amplitude-frequency characteristics of a broadband electro-optical intensity modulator based on low-speed optical down-conversion sampling technology. Background technique [0002] With the development of broadband optical fiber communication, microwave photonics and other technologies, the bandwidth and other parameters of the electro-optic intensity modulator, one of the key devices, have also increased. In broadband application systems, the amplitude-frequency characteristic of the intensity modulator mainly refers to the change of half-wave voltage with frequency, which will affect the overall performance of the system. Therefore, the accurate measurement of the half-wave voltage of the intensity modulator is of great significance for performance optimization in system design and characteristic evaluation in device manufacturing. [...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01M11/02
CPCG01M11/00
Inventor 马阳雪张旨遥张尚剑张雅丽刘永
Owner UNIV OF ELECTRONICS SCI & TECH OF CHINA
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