Crop yield estimation method based on dual-polarized synthetic aperture radar and crop model data assimilation
A technology of aperture radar and model data, applied in the field of agricultural remote sensing, can solve problems such as high-precision estimation of crop yield in difficult areas
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment 1
[0053] For the flow chart of the crop yield estimation method for corn yield estimation using the dual-polarization synthetic aperture radar and crop model data assimilation of the present invention, please refer to the attached figure 1 .
[0054] S1 collects Sentinel-1 data during the maize growth period in the study area, performs preprocessing such as terrain correction, and obtains the backscatter coefficients of the two polarizations (VH, VV) of the time series C band, that is, dual-polarization SAR data;
[0055] Hengshui City, Hebei Province was selected as the research area, which is located between 115°10′-116°34′ east longitude and 37°03′-38°23′ north latitude. The total area of the study area is 8815km2, the terrain is mainly plains, and the cultivated land accounts for more than 60% of the total area. It belongs to the warm temperate semi-humid monsoon climate, with annual sunshine hours of 2400-3100h and annual average precipitation of 300-800mm.
[0056] The ...
PUM
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com