Complete machine level product storage life acceleration test method
A storage life and accelerated test technology, which is applied to measuring devices, instruments, scientific instruments, etc., can solve the problems of inaccurate test results, high cost, and test pieces that cannot meet the test requirements, and achieve the effect of accurate life analysis results
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[0058] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be described in further detail below in conjunction with specific embodiments and with reference to the accompanying drawings.
[0059] It should be noted that all expressions using "first" and "second" in the embodiments of the present invention are to distinguish two entities with the same name but different parameters or parameters that are not the same, see "first" and "second" It is only for the convenience of expression, and should not be construed as a limitation on the embodiments of the present invention, which will not be described one by one in the subsequent embodiments.
[0060] In view of the fact that most of the current product acceleration tests can only be adapted to lower-level products and cannot meet the accelerated test of complete machine-level products, this application is based on the failure mechanism and failure mode of co...
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