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Method for testing ultra-sparse antenna array transmit-receive beam pattern

A beam pattern, sparse antenna technology, applied in related application fields, can solve problems such as ground pattern testing, and achieve the effects of shortening test time, improving test accuracy, and overcoming discomfort

Active Publication Date: 2018-07-20
NO 54 INST OF CHINA ELECTRONICS SCI & TECH GRP
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Problems solved by technology

The present invention is more suitable for the far-field pattern test of super-sparse and distributed antenna arrays such as regional antenna arrays and networked radars, and overcomes the problem that such arrays cannot perform ground pattern tests

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  • Method for testing ultra-sparse antenna array transmit-receive beam pattern

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Embodiment Construction

[0023] Reference figure 1 , To further explain the present invention.

[0024] A testing method for transmitting and receiving beam patterns of a super-sparse antenna array is characterized by comprising the following steps:

[0025] ①The inter-antenna delay difference / phase difference model unit selects antenna 1 as the reference antenna according to the external input antenna 1~antenna N delay / phase prediction model, and the antenna 1~antenna N delay / phase prediction model is respectively delayed / phased with the reference antenna The prediction model is corrected to obtain the inter-antenna delay difference / phase difference polynomial model corresponding to each antenna 1~antenna N; according to the residual delay difference and the initial value of the residual phase difference output by the self-spectrum and cross-spectrum calculation unit, the antenna 1~antenna N Corresponding inter-antenna delay difference / phase difference polynomial models are corrected one by one, and N mo...

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Abstract

The invention discloses a method for testing an ultra-sparse antenna array transmit-receive beam pattern, and mainly solves the problem that an existing measuring method and system cannot carry out ground pattern testing on an ultra-sparse antenna array. The method includes the steps of using multiple antennas to receive echo signals of a same satellite, obtaining the delay difference and the phase difference between the antennas by utilizing an FX correlation synthesizer to serve as zero values of the antenna delay difference and the phase difference between antennas; performing rasterizationon the incoming wave direction in the width of the single-antenna beam on the basis, carrying out accurate compensation on the satellite signals received by the antennas through the corresponding delay difference and the phase difference, so that the test of the super-sparse antenna array transmit-receive beam pattern is achieved. The method has the advantages of high delay / phase measurement precision, and simple and reliable method. The method is more suitable for far-field pattern test of a regional antenna array, networked radar and other super-sparse and distributed antenna arrays.

Description

Technical field [0001] The invention relates to antenna array signal synthesis technology, distributed network radar coherent synthesis technology, interferometric data processing technology, etc. in deep space measurement and control communication, and is particularly suitable for distributed arrays such as large-scale receiving antenna arrays and networked radars. Antenna transceiver beam synthesis test, synthesis efficiency analysis and evaluation and other related application fields. Background technique [0002] In the deep space measurement and control communication system, the distance between the deep space spacecraft target and the earth observation station is from tens of millions to hundreds of millions of kilometers, which makes the received signal strength of the existing measurement and control communication equipment very weak. The distributed transceiver antenna array is It is an effective means to improve the SNR of transmitting ERIP and receiving signals; in a n...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R29/10G01S7/40
CPCG01R29/10G01S7/4004
Inventor 刘友永杨伟军
Owner NO 54 INST OF CHINA ELECTRONICS SCI & TECH GRP
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