Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Display panel to be tested and testing method thereof, display panel and motherboard, display device

A display panel, a technology to be tested, applied in the field of display panels, motherboards, and display devices, which can solve problems such as the inability to click out solid-color images

Active Publication Date: 2021-05-07
BOE TECH GRP CO LTD
View PDF10 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0007] Embodiments of the present invention provide a display panel to be tested and a detection method thereof, a display panel, a motherboard, and a display device, which are used to solve the problem that the display panel using the SPR technology cannot be detected by using the existing panel function test method. Point out the problem of solid color screen

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Display panel to be tested and testing method thereof, display panel and motherboard, display device
  • Display panel to be tested and testing method thereof, display panel and motherboard, display device
  • Display panel to be tested and testing method thereof, display panel and motherboard, display device

Examples

Experimental program
Comparison scheme
Effect test

preparation example Construction

[0034] The preparation of display panels, such as TFT-LCD (Thin Film Transistor Liquid Crystal Display, thin film transistor-liquid crystal display) display panel preparation includes array (Array) substrate process, color filter (CF) substrate process and array substrate and color filter substrate. In the cell process, the panel function test is generally carried out during the cell process, and the defects of the substrate panel in the three processes of Array, CF, and Cell are used to remove the defective products before attaching the driver chip to improve the display. Yield of panel preparation. Usually, the display panel before the driver chip is pasted is referred to as the display panel to be inspected.

[0035] For a display panel using SPR technology, each pixel has sub-pixels of two colors, and the four sub-pixels corresponding to two adjacent pixels can cover the three colors provided by the display panel, for example figure 2 and image 3 As shown, pixel 10 has...

Embodiment 1

[0038] An embodiment of the present invention provides a display panel to be tested, such as Figure 4 and Figure 5 As shown, the display panel to be tested includes a sub-pixel array formed by multiple rows of sub-pixels and multiple columns of sub-pixels, each row of sub-pixels is driven by the same gate line, and each column of sub-pixels is driven by the same data line.

[0039] Wherein, all rows of sub-pixels with the same color distribution in multiple rows of sub-pixels form a row pixel group, and multiple rows of sub-pixels constitute at least two row pixel groups; at least two of the gate lines used to drive each row pixel group Electrically connected via connecting wires.

[0040] All the column sub-pixels with the same color distribution in the multiple columns of sub-pixels form a column pixel group, and the multiple columns of sub-pixels form at least two column pixel groups; at least two of the data lines used to drive each column pixel group are electrically c...

Embodiment 2

[0056] This embodiment provides a detection method of the display panel to be detected as described in Embodiment 1, the detection method can drive all sub-pixels of a color in the display panel to be detected to display, including the following steps:

[0057] Sequentially input the row driving signal to the gate line corresponding to each row pixel group, and input the data signal to the data line corresponding to the column pixel group to which the sub-pixel of the above color in the row pixel group belongs, so as to sequentially light up the above-mentioned colors in each row pixel group of sub-pixels.

[0058] It should be noted that the gate lines corresponding to a row of pixel groups refer to all the gate lines used to drive the row of pixel groups. Wherein, the row driving signals are respectively input to the gate lines of each row of pixel groups, the gate lines of each row of pixel groups receive the row driving signals at the same time, and while the row driving s...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

Embodiments of the present invention provide a display panel to be tested and a detection method thereof, a display panel, a motherboard, and a display device, which relate to the field of display technology and are used to solve the problem of using an existing panel function test method to detect a display panel using SPR technology , the problem that the solid color screen cannot be clicked. The display panel to be tested includes a sub-pixel array formed by multiple rows of sub-pixels and multiple columns of sub-pixels, each row of sub-pixels is driven by the same gate line, and each column of sub-pixels is driven by the same data line. All rows of sub-pixels with the same color distribution in the multiple rows of sub-pixels constitute a row pixel group, and the multiple rows of sub-pixels constitute at least two row pixel groups; at least two of the gate lines used to drive each row of pixel groups are connected by Line electrical connection; all column sub-pixels with the same color distribution in multiple columns of sub-pixels form a column pixel group, and multiple columns of sub-pixels form at least two column pixel groups; at least two of the data lines used to drive each column pixel group pass through Connecting wires for electrical connection.

Description

technical field [0001] The invention relates to the field of display technology, in particular to a display panel to be tested and a testing method thereof, a display panel, a motherboard, and a display device. Background technique [0002] When preparing a display panel, before attaching the driver chip and the flexible circuit board for inputting the display signal, the panel function test (English full name: Cell Test, English abbreviation: CT) is usually carried out to detect defects in the display panel production process. . In this test process, by inputting a detection signal to the display panel, the sub-pixels of one color are driven to display, so that the display panel displays a solid-color picture, and through the display picture, it is judged whether each signal line of the display panel is disconnected or short-circuited, or whether each sub-pixel Whether there will be defects such as light leakage between pixels. [0003] The pixel arrangement of the tradit...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): G09G3/00
CPCG09G3/006
Inventor 盖翠丽林奕呈
Owner BOE TECH GRP CO LTD
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com