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A Sampling Method of Electron Multiple Scattering Angle Based on Selection Sampling

A multiple scattering and electronic technology, applied in electrical digital data processing, instruments, design optimization/simulation, etc., can solve problems such as large amount of calculation, limited simulation efficiency, time-consuming, etc., and achieve the effect of improving efficiency

Active Publication Date: 2018-12-25
中科超精(南京)科技有限公司
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Problems solved by technology

Taking the EGS5 program as an example, the series expansion can be expanded up to 15,000 orders, so it is very time-consuming to calculate the value of this function every time.
However, in order to sample multiple scattering angles from the distribution function, the current algorithm generally needs to calculate the values ​​of the distribution function at multiple angles, and then sample multiple scattering angles according to the cumulative probability density function, which requires a large amount of calculation and limits the simulation efficiency. , a sampling method that evaluates the function as little as possible is necessary

Method used

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  • A Sampling Method of Electron Multiple Scattering Angle Based on Selection Sampling
  • A Sampling Method of Electron Multiple Scattering Angle Based on Selection Sampling

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Embodiment 1

[0034] A method for sampling electron multiple scattering angles based on selection sampling, comprising the following steps:

[0035] (1) According to the transport step size, particle energy, transport medium and cross-section database data, construct a small-angle approximation distribution function F of the multiple scattering angle θ SA (θ);

[0036] (2) Calculate the theoretical distribution function F of the multiple scattering angle θ MS (θ) and F SA The maximum value f of the quotient f(θ) of (θ) max ;

[0037] (3) According to F SA (θ) Direct sampling multiple scattering angle θ sample ;

[0038] (4) Calculate f(θ sample ), and sample a random number ζ in [0,1], if ζsample ) / f max , then accept θ sample , otherwise return to step (3).

[0039] In this embodiment, the original accurate multiple scattering angle distribution F is MS (θ) is decomposed into the product F of two parts MS (θ)=F SA (θ)×f(θ), the previous part F SA (θ) is directly sampled, and ...

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Abstract

The invention discloses an electronic multi-scattering-angle sampling method based on acceptance-rejection sampling. The method comprises the following steps: (1) constructing a small angle similar distribution function FSA (theta) of multiple scattering angles theta; (2) calculating the maximum value fmax of the quotient f (theta) of theoretical distribution functions FMS (theta) and FSA (theta) of the multiple scattering angles theta; (3) directly sampling the multiple scattering angles theta sample according to FSA (theta); and (4) calculating f (theta sample), sampling a random number zeta in the range of [0, 1], if zeta less than f (theta sample) / fmax, receiving theta sample, and if zeta is not less than f (theta sample) / fmax, returning to the step (3). The multiple scattering angles of transportation of electrons in a medium can be sampled rapidly and accurately, the electronic Monte Carlo transportation simulation efficiency is improved, and the method can be widely applied to the field of radiation transportation simulation, the field of Monte Carlo particle transportation simulation and the like.

Description

technical field [0001] The invention belongs to the field of particle transport simulation, in particular to an electron multiple scattering angle sampling method based on selection sampling. Background technique [0002] The Monte Carlo method is widely used in particle transport simulations because it directly tracks the transport process of particles, [0003] The method is intuitive; the required physical simplification is less, so the accuracy is high; at the same time, the simulation method does not depend on the specific calculation amount, so the versatility is strong, and the output is flexible and comprehensive. However, unlike neutral particles such as neutrons and photons, charged particles such as electrons collide very frequently when transporting in matter due to Coulomb long-range interaction. 10 5 -10 6 Secondary collisions, most of which are Coulomb scattering. Therefore, for electrons, it is not possible to simulate each collision one by one like the M...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G06F17/50
CPCG06F30/20
Inventor 汪晖胡丽琴
Owner 中科超精(南京)科技有限公司
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