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Optoelectronic measuring device, optoelectronic measuring method, computer readable medium

A technology for optoelectronic measurement and optical devices, applied in active optical measurement devices, measurement devices, radio wave measurement systems, etc., to solve problems such as insufficient and inaccurate measurements, and to achieve reduced demand and high acceptable measurement radiation power. Effect

Active Publication Date: 2021-02-26
HEXAGON TECH CENT GMBH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

In this case, the pulse detection and the signal-to-noise ratio are correspondingly improved, although long distances and / or objects at great distances are not measurable or can only be measured insufficiently or imprecisely

Method used

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  • Optoelectronic measuring device, optoelectronic measuring method, computer readable medium
  • Optoelectronic measuring device, optoelectronic measuring method, computer readable medium
  • Optoelectronic measuring device, optoelectronic measuring method, computer readable medium

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Embodiment Construction

[0053] figure 1 Shows the solar global radiation incident on the Earth (at sea level) according to wavelength. The total radiation has a maximum in the visible range of the radiation spectrum and falls towards the near-infrared range. That is to say that for outdoor measurements the measurement radiation with wavelengths in the near infrared range from a wavelength of about 1150 nm is at least three times smaller than at 550 nm. In addition, the atmospheric window with high light transmission is located between 1150nm and 1350nm. According to the invention, radiation sources in this spectral range are more advantageous than measuring radiation in the visible range, for example, using the known wavelengths 532nm, 635nm, but also the range adjacent to the IR spectrum, for example, 1064nm, because in this range , the interfering influence of natural external radiation and / or background radiation is significantly smaller. In particular, the total radiation is particularly low ...

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Abstract

Optoelectronic measuring device, optoelectronic measuring method, computer readable medium. An optoelectronic measuring device (1) for distance determination and / or position determination comprising: a radiation source (35, 40, 75, 310) for generating optical measuring radiation (30, 36) of a first wavelength, wherein The measuring radiation (30, 36) is emitted into free space in a directed manner. The radiation source (35, 40, 75, 310) is designed such that the first wavelength is in the range between 1210nm and 1400nm, and the power of the emitted measurement radiation (30, 36) is temporally and spatially averaged to be at least 14mW.

Description

technical field [0001] The invention relates to a photoelectric measuring device and a photoelectric measuring method. Background technique [0002] Various forms of optoelectronic measuring devices are known, with which to determine distance and / or position based on optical radiation. Examples are geodetic devices such as electronic tachymeters, total stations, multistations, or laser scanners for geodetic or industrial surveying purposes, laser trackers, or hand-held electronic rangefinders or direction finders. These devices share the feature that they comprise at least one radiation source for generating measuring radiation and optical means such as lenses, optical fibers or collimators, by means of which the generated measuring radiation can be directed towards the object to be measured are emitted into free space, for this reason these devices are also referred to as so-called free beam sensors. For example, the target to be measured is a point on the surface of a na...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01S17/32
CPCG01S17/32G01C3/08G01C15/002G01S17/42G01S17/66G01S17/08G01S7/4802G01S7/4814G01S7/4812
Inventor J·辛德林
Owner HEXAGON TECH CENT GMBH
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