Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Adaptive orthogonal wavelet image denoising method based on accurate local variance priori modeling

A local variance and orthogonal wavelet technology, applied in image enhancement, image analysis, image data processing, etc., can solve the problems of low peak signal-to-noise ratio, artifacts, and poor visual effects of denoised images, so as to improve visual effects , improve the peak signal-to-noise ratio, and the effect of low computational complexity

Active Publication Date: 2016-10-12
JINAN RICHNES ELECTRONICS CO LTD
View PDF2 Cites 8 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] However, due to the poor estimation of the exponential prior parameter λ in its method, the modeling effect on the local variance θ is not ideal, which directly affects the performance of the denoising algorithm
The peak signal-to-noise ratio of the denoised image is not high, and the areas with rich details such as edges and textures in the denoised image have serious artifacts and poor visual effects

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Adaptive orthogonal wavelet image denoising method based on accurate local variance priori modeling
  • Adaptive orthogonal wavelet image denoising method based on accurate local variance priori modeling
  • Adaptive orthogonal wavelet image denoising method based on accurate local variance priori modeling

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0028] Below in conjunction with accompanying drawing, the present invention is described in further detail:

[0029] The present invention provides an adaptive orthogonal wavelet image denoising method based on accurate local variance prior modeling. The method uses maximum likelihood estimation to accurately model the prior distribution of the local variance of the orthogonal wavelet transform detail coefficients. In this way, better denoising performance is obtained, the peak signal-to-noise ratio of the denoising image is improved, and the visual effect of the denoising image is improved.

[0030] 1. Orthogonal wavelet decomposition

[0031] Select the base wavelet, determine the number of wavelet decomposition layers L, and perform L-layer orthogonal wavelet transform on the noisy image to obtain the overview subband coefficient A and the detail subband coefficient H of each layer l , V l 、D l , l=1, 2, . . . , L.

[0032] 2. Modeling of detail subband coefficients

...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention provides an adaptive orthogonal wavelet image denoising method based on accurate local variance priori modeling. The method is characterized by carrying out accurate modeling on orthogonal wavelet transform detail coefficient local variance prior distribution through maximum likelihood estimation, thereby realizing a better denoising performance, improving peak signal-to-noise ratio of a de-noised image, and improving visual effect of the de-noised image. The beneficial effects are that the method overcomes the defect that an existing method is not high in local variance estimation, can better express statistical property of the image orthogonal wavelet decomposition detail coefficient, can give a denoising result adaptively, can remove additive white Gaussian noise in a natural image more effectively, and meanwhile, can better protect regions having rich edge and texture detail information and the like in an original image, and improves visual effect and peak signal-to-noise ratio of the de-noised image. The method is low in computation complexity, and is suitable for immense image denoising application in the age of big data.

Description

technical field [0001] The invention relates to an adaptive orthogonal wavelet image denoising method based on accurate local variance prior modeling. Background technique [0002] At present, noise is unavoidable in the process of image acquisition and transmission, and image denoising is an important research topic in the field of image processing. Wavelet transform is an efficient multi-resolution time-frequency analysis method. Orthogonal wavelet transform has the advantages of high computational efficiency and small coefficient redundancy, and is widely used in the field of image denoising. Under the denoising framework of additive Gaussian white noise, given the wavelet transform coefficient y=x+n of the noise image obtained, the purpose of denoising is to restore the original clean image x without distortion as much as possible while suppressing the noise n . [0003] The basic principle of wavelet denoising is to use the different characteristics of image informati...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G06T5/00
CPCG06T2207/20064G06T2207/20192G06T5/70
Inventor 刘云霞杨阳
Owner JINAN RICHNES ELECTRONICS CO LTD
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products