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OFRF (output frequency response function) modeling based nonlinear analog circuit fault parameter identification method

A technology for simulating circuit faults and parameter identification. It is used in analog circuit testing, electronic circuit testing and other directions. It can solve the problems of too many measuring points, not completely solved, and poor convergence effect, so as to improve the identification accuracy and improve the diagnosability. Effect

Inactive Publication Date: 2015-04-08
NANJING AGRICULTURAL UNIVERSITY
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

However, the former method has poor convergence effect, and the latter method has the disadvantage of large amount of calculation.
In recent years, new progress has been made in parameter identification methods, such as neural network modeling method and Volterra series modeling method. not completely resolved

Method used

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  • OFRF (output frequency response function) modeling based nonlinear analog circuit fault parameter identification method
  • OFRF (output frequency response function) modeling based nonlinear analog circuit fault parameter identification method
  • OFRF (output frequency response function) modeling based nonlinear analog circuit fault parameter identification method

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Experimental program
Comparison scheme
Effect test

Embodiment 1

[0033] The fault parameter identification method for nonlinear analog circuits based on OFRF modeling includes the following steps:

[0034] A. adopt the multi-frequency sinusoidal signal u(t) to excite the nonlinear analog circuit to be tested, and collect the output data sample y(t) of the nonlinear analog circuit;

[0035] B. According to the OFRF theory of the output frequency domain response function, the OFRF mathematical model of the nonlinear system is established based on the relationship between the multi-frequency sinusoidal signal u(t) and the output data sample y(t), and the relationship between the output of the nonlinear analog circuit and the component parameters relationship between

[0036] C. Use the ant colony algorithm to evolve the component parameter values ​​of the nonlinear analog circuit, and compare with the normal component parameter values ​​to identify the parameter values ​​of the faulty components.

Embodiment 2

[0038] On the basis of Embodiment 1, the multi-frequency sinusoidal signal described in step A is expressed as:

[0039] u(t)=Asin(2πf 1 t)+Asin(2πf 2 t)+…+Asin(2πf n t) (1)

[0040] Among them, A is the initial amplitude, f 1 , f 2 ,...,f n For n different frequency components.

Embodiment 3

[0042] On the basis of Embodiment 2, the n different frequency components are obtained by a frequency sweep method, which are the inflection point frequencies in the frequency sweep curve.

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Abstract

The invention discloses an OFRF (output frequency response function) modeling based nonlinear analog circuit fault parameter identification method. The method includes the following steps: A, adopting a multi-frequency sinusoidal signal u(t) to excite a to-be-tested nonlinear analog circuit, and collecting an output data sample y(t) of the nonlinear analog circuit; B, establishing an OFRF mathematical model of a nonlinear system according to the OFRF theory and the relation between the multi-frequency sinusoidal signal u(t) and the output data sample y(t) to acquire relationship between output of the nonlinear analog circuit and component parameters; C, adopting an ant colony algorithm to evolve component parameter values of the nonlinear analog circuit, comparing the component parameter values with normal component parameter values, and identifying parameter values of fault components. By the method, the multi-frequency sinusoidal signal is taken as test excitation of the nonlinear analog circuit, the OFRF system model is adopted, and accordingly efficiency and accuracy of identification of the parameter values of the fault components in the nonlinear analog circuit can be improved.

Description

technical field [0001] The invention relates to a parameter identification method for nonlinear analog circuit fault components, in particular to a nonlinear analog circuit fault parameter identification method based on frequency domain response function modeling. Background technique [0002] With the increasing complexity and functionality of electronic equipment, reliability research plays an extremely important role in the design and testing of complex electronic equipment. Analog circuits are an integral and important part of electronic equipment. So far, the fault diagnosis technology of linear analog circuits is relatively mature, among which the fault dictionary method and intelligent diagnosis algorithm are research hotspots, but because it is difficult to obtain an accurate circuit model for nonlinear circuits, the location of fault components and parameter identification are still difficult to solve , nonlinear analog circuit diagnosis has been a difficult resear...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/316
Inventor 罗慧蹇兴亮郭海燕
Owner NANJING AGRICULTURAL UNIVERSITY
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