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Fast image stitching method based on high-precision large-format scanner system

A fast stitching, large-format technology, applied in image enhancement, image data processing, instruments, etc., to achieve high precision, affordable price, and maintain accuracy

Inactive Publication Date: 2014-10-15
NINGBO MOSHI OPTOELECTRONICS TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0004] However, according to the current market price analysis, the increase in the length of CIS is far behind the increase in price, and the price of a longer CIS is much higher than that of a shorter CIS. However, due to its own characteristics, the length of a CIS is required by large format scanners. Higher, in order to ensure that the scanning accuracy of CIS remains unchanged, it is very important to provide a CIS that can perform large-format scanning with a large width

Method used

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  • Fast image stitching method based on high-precision large-format scanner system
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  • Fast image stitching method based on high-precision large-format scanner system

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Embodiment

[0041] Such as figure 1 , the implementation steps of the present invention are specifically as follows:

[0042] (1) According to figure 2 The effect of the CIS will be arranged in order

[0043] There are 5 CISs in this embodiment, which are marked as CIS No. 1, CIS No. 2, CIS No. 3, CIS No. 4, and CIS No. 5 from left to right. Such as figure 2 As shown, No. 2 CIS is parallel to No. 1 CIS and located below No. 1 CIS. The left end part overlaps with No. 1 CIS to prevent the gap between No. 1 CIS and missing part of the media scanning. No. 3 CIS is located above No. 2 CIS. It is at the same height as CIS No. 1, and the left end part overlaps with CIS No. 2. By analogy, five CISs are arranged in parallel up and down in a staggered manner, and the medium to be scanned is below the CIS, and the direction of the arrow is the scanning direction.

[0044] (2) After the CIS arrangement is completed, obtain the splicing parameters of each CIS

[0045] The splicing parameters o...

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Abstract

The invention discloses a fast image stitching method based on a high-precision large-format scanner system. The high-precision stitching of images can be finished by obtaining stitching parameters, forming a stitching parameter model and substituting the stitching parameter model into a data flow to realize simple stitching steps. The method overcomes the defect of high cost caused by that a long CIS (Contact Image Sensor) needs to be adopted for scanning. A plurality of CISs are overlapped and staggered to scan to guarantee high precision, while cost is saved, an operation is simple, the CIS can be disassembled and cleaned, and the method is suitable for promoting and using.

Description

[0001] technical field [0002] The invention relates to an image processing work of a large-format scanner system, in particular to the image splicing work of the large-format scanner system. Background technique [0003] Compared with the large-format scanner using CCD (Charge-coupled Device) image sensor to scan, the large-format scanner that uses CIS (Contact Image Sensor) image sensor not only saves greatly in cost and greatly simplifies the structure, but also For scanning pages on larger media, high precision is achieved without the annoyance of image distortion problems. [0004] However, according to the current market price analysis, the increase in the length of CIS is far behind the increase in price, and the price of a longer CIS is much higher than that of a shorter CIS. However, due to its own characteristics, the length of a CIS is required by large format scanners. Higher, in order to ensure that the CIS scanning accuracy remains unchanged, it is very impor...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06T5/50
Inventor 赵泽东唐雪松陈仕隆吕坤杨雷
Owner NINGBO MOSHI OPTOELECTRONICS TECH
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