Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Ultra-intense femtosecond laser pulse full-parameter in-situ measurement system, measurement method and application

A femtosecond laser and laser pulse technology, applied in instruments and other directions, can solve the problems of large error, poor physical correlation and real-time performance, small sensitivity and dynamic range, etc.

Inactive Publication Date: 2015-09-23
PEKING UNIV
View PDF4 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The estimation method of the former has a large error (even reaching several times the real value), while the sensitivity and dynamic range of the latter measurement are very small (related to the ionization characteristics of the working medium)
In addition, the various parameters of the pulse used to calculate the measurement results are separately measured with different measurement methods, different experimental devices, and different times, and the measurement and calculation results are a statistical value that is physically related to various parameters. Poor performance and real-time performance
In short, how to quickly and accurately measure the specific and detailed time structure of these light pulses has always been a challenge for the scientific community

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Ultra-intense femtosecond laser pulse full-parameter in-situ measurement system, measurement method and application
  • Ultra-intense femtosecond laser pulse full-parameter in-situ measurement system, measurement method and application
  • Ultra-intense femtosecond laser pulse full-parameter in-situ measurement system, measurement method and application

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0048] In the following, the present invention will be further explained through specific embodiments in conjunction with the drawings.

[0049] Such as figure 1 As shown, the ultra-strong femtosecond laser pulse full parameter in-situ measurement system of this embodiment includes: a picosecond or sub-picosecond laser pulse 1, a spectroscope 2, a separator 5, a laser pulse compression unit 8, a first noble gas atom 4 and the second gas atom 11, the first and second converging mirrors 3 and 10, the first to third mirrors 6, 7 and 9 and the photoelectron spectrometer 12; among them, the picosecond or sub-picosecond laser pulse 1 passes After the beam splitter 2 is split into two laser beams; one beam directly excites the first inert gas atoms 4 emitted from the first gas nozzle A after passing through the first convergent lens 3 to generate forward-emitted high-order harmonic radiation, namely X-rays; The X-rays and laser pulses pass through the separator to filter out the laser. ...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses an ultrastrong femtosecond laser pulse all-parameter in-situ measurement system and measurement method and application. Femtosecond laser pulses are measured through X-ray; all parameters of the femtosecond laser pulses can be derived through a photoelectron spectroscopy obtained through measurement, including strength, pulse time width, carrier-envelope phase and pulse shape; the measurement method is a physical method, and no hypothesis is needed; and the measurement method is an analytic method, and time resolution measurement, data fitting and iterative computations are not needed. The measurement method is an in-situ measurement method, no change is needed to be made for the state of the femosecond laser pulse to be measured, the measurement result can directly reflect the physical relevance among all the parameters, and the measurement result is real-time, rapid and high in precision. The range of laser strength can reach 4-5 orders of magnitudes, the relative precision of the method is 0.1 % better than the precision of the laser strength, and is 1 % better than other parameters, and the method can widely be applied to scientific experiments and engineering surveying.

Description

Technical field [0001] The invention belongs to ultra-strong and ultra-fast optics, and in particular relates to an in-situ measurement system for all parameters of ultra-strong femtosecond laser pulses, and a measurement method and application. Background technique [0002] Various super-strong and ultra-short laser pulses have been widely used in scientific experiments and engineering technology, such as high-order harmonic radiation, above-threshold ionization, nonlinear laser-electron Compton scattering, laser ion acceleration, etc. For the measurement of laser frequency, there are relatively mature methods, but for the in-situ measurement of all parameters such as the intensity (ie energy density), pulse width, carrier-envelope phase, and pulse intensity time distribution of super-strong laser pulses, it has been It is one of the scientific problems. When the laser pulse intensity is low, it can be measured with photodiodes, photomultiplier tubes, various silicon detectors,...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): G01J11/00
Inventor 葛愉成
Owner PEKING UNIV
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products