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Method and device for measuring three fields independently and synchronously in real time by using three-dimensional digital speckle pattern interferometry

A speckle interference, three-dimensional digital technology, applied in measurement devices, optical devices, instruments, etc., can solve the problem of inability to achieve independent, synchronous and real-time measurement of three displacement subfields, and achieve precise phase measurement, accuracy improved effect

Inactive Publication Date: 2013-06-12
NANJING UNIV OF AERONAUTICS & ASTRONAUTICS
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Problems solved by technology

[0005] The technical problem to be solved by the present invention is that none of the existing technologies can achieve independent, synchronous and real-time measurement of the three displacement sub-fields

Method used

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  • Method and device for measuring three fields independently and synchronously in real time by using three-dimensional digital speckle pattern interferometry

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Embodiment Construction

[0013] The present invention will be further described below in conjunction with accompanying drawing.

[0014] Such as figure 1 As shown, the device of the present invention includes three digital speckle interference optical paths:

[0015] Digital speckle interference optical path I: including the first CCD imaging system 2, laser 1 and beam splitter 7, the beam splitter 7 and the first CCD imaging system 2 are coaxially arranged on a straight line, the beam splitter The back of the reference surface of 7 is provided with a piezoelectric ceramic phase shifter.

[0016] Digital speckle interference optical path II: including the second CCD imaging system 3, two plane mirrors 5, and a right-angle total inversion triangular prism 6, and the two plane mirrors 5 are symmetrically placed on both sides of the second CCD imaging system 3 in the horizontal direction; One of the two planar mirrors 5 is provided with a piezoelectric ceramic phase shifter on its back.

[0017] Digit...

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Abstract

The invention discloses a method and a device for measuring three fields independently and synchronously in real time by using three-dimensional digital speckle pattern interferometry. The measurement device comprises three independent digital speckle pattern interferometric light paths. The method comprises the following steps of: synchronously acquiring three images of a measured object which is undeformed as reference images and three real-time images of the measured object which is deformed by using the three independent digital speckle pattern interferometric light paths, and subtracting the reference images from the corresponding real-time images to obtain three real-time speckle pattern interferometric fringe patterns; accurately acquiring a plurality of speckle pattern interferometric fringe patterns with equal phase shift, and extracting three phase images of the measured object which is deformed by using a phase shift algorithm; unpacking the three phase images by using a computer to further obtain three continuous phase unwrapping patterns; and calculating three-dimensional displacement components of the measured object by using the phase unwrapping patterns respectively. Three displacement sub-fields can be measured synchronously and independently in real time, and the method and the device are applied to dynamic problems as well as the accurate phase measurement of three-dimensional displacement sub-fields.

Description

technical field [0001] The invention relates to three-dimensional deformation of objects by using three-dimensional digital speckle interference technology , with The invention discloses a method and device for independent, synchronous and real-time measurement of three displacement sub-fields, belonging to the technical field of digital speckle interference three-dimensional deformation measurement. Background technique [0002] Since the deformation of an object is usually three-dimensional deformation, the research on the method and device of three-dimensional deformation measurement by digital speckle interferometry has important academic significance and wide application value. [0003] At present, there are two main types of digital speckle interference three-dimensional deformation measurement technology: the first type is non-coplanar three-beam digital speckle interferometry technology. The three displacement sub-fields obtained by this technology are coupled w...

Claims

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Application Information

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IPC IPC(8): G01B11/16G01B11/02
Inventor 王开福顾国庆
Owner NANJING UNIV OF AERONAUTICS & ASTRONAUTICS
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