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Pick and Place Devices for Test Handlers

A technology for testing sorters and pick-and-place devices, used in semiconductor/solid-state device testing/measurement, sorting, electrical components, etc. Ensuring design freedom, reducing production costs, and easy-to-control effects

Active Publication Date: 2015-11-18
TECHWING CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0013] First, because the servo motor is expensive, the unit production cost of the equipment increases (roughly there are at least two pick-and-place devices in a test sorter)
[0014] Second, if the operator at the work site is not familiar with the operation of changing the control value of the servo motor or makes a mistake, the desired interval adjustment cannot be achieved.
[0015] Third, because of the heavy servo motor (including the attached pulley, etc.), the inertia of the pick-and-place device increases, making it difficult to control the movement

Method used

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  • Pick and Place Devices for Test Handlers
  • Pick and Place Devices for Test Handlers
  • Pick and Place Devices for Test Handlers

Examples

Experimental program
Comparison scheme
Effect test

no. 1 example

[0042] figure 1 and figure 2 It is a front view and a rear view of a pick-and-place device 100 for a test handler (hereinafter simply referred to as "pick-and-place device") according to the first embodiment of the present invention.

[0043] like figure 1 and figure 2 As shown, the pick-and-place device 100 includes eight picker modules 111 to 118 , a pair of first guide rails 121 , 122 , a cam plate 130 , a pair of second guide rails 141 , 142 , a cylinder 150 , a stopper 160 and the like.

[0044] The eight picker modules 111 to 118 are respectively movable horizontally and each have at least one picker P for gripping a semiconductor component. Reference, figure 1 and figure 2 Restricted by the front view and the rear view, it is only shown that there is only one picker P on one picker module 111 / 112... / 118, but according to the implementation needs, multiple The picker P is unquestionable, in fact, in this embodiment, it is also assumed that one picker module 111 / ...

no. 2 example

[0065] Figure 8a and Figure 8b The cam plate 830 and the stop member 860 applied to the pick-and-place device of the second embodiment of the present invention are respectively shown.

[0066] like Figure 8a As shown, the cam plate 830 of this embodiment has a plurality of incomplete first open cam grooves 831a to 838a with open upper sides, and has a Figure 8b The reinforcing rib R of the limiting part 860. In addition, a step is formed on the surface of the cam plate 830 on which the stopper 860 is installed, so that the stopper 860 can be properly installed.

[0067] and, if Figure 8b As shown, the limiting member 860 of this embodiment has a plurality of second open cam grooves 861 a to 868 a with open lower sides.

[0068] That is, the first open cam grooves 831a / ... / 838a and the second open cam grooves 861a / ... / 868a are opened toward the facing sides, respectively, so that as Figure 9 As shown, when the stop member 860 is set, the first open cam groove 831a / ....

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PUM

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Abstract

The invention relates to a pick and place apparatus for a testing separator. According to the invention, through further arranging limiting parts, gap adjusting range of a cap plate is limited, wherein the gap adjusting range is used for adjusting gaps among a plurality of picker modules of the pick and place apparatus, so that the gap adjusting range among the picker modules can be easily changed.

Description

technical field [0001] The present invention relates to a pick-and-place device for moving a semiconductor element to a desired position after gripping the semiconductor element in a test handler. Background technique [0002] The test sorter is to load multiple semiconductor components manufactured through a predetermined manufacturing process from the customer tray (CUSTOMERTRAY) to the test tray (TESTTRAY), and support multiple semiconductor components loaded on the test tray so that they can be tested A device that classifies semiconductor components into grades according to test results, and then unloads semiconductor components from test trays to user trays has been disclosed in multiple publications. [0003] In addition to the above-mentioned user trays and test trays, the test handler is equipped with an aligner (ALIGNER) formed in the loading section or a buffer (BUFFER) for storing and loading redundant semiconductor components. The pneumatic loading table introd...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): B07C5/00H01L21/683H01L21/66
Inventor 罗闰成权宁镐
Owner TECHWING CO LTD
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