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Bayesian reliability comprehensive estimation method based on multisource degraded data

A technology of degraded data and comprehensive evaluation, which is applied in the fields of electrical digital data processing, special data processing applications, instruments, etc., to achieve the effect of increasing the amount of information and expanding the scope of data

Inactive Publication Date: 2011-09-28
BEIHANG UNIV
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Problems solved by technology

[0007] The purpose of the present invention is to solve the problem of using degradation data to comprehensively evaluate the reliability of products, and proposes a comprehensive reliability evaluation method for accelerated degradation tests and degradation data, so as to meet the increasingly widely used in the field of reliability evaluation. The status quo of accelerated degradation test and its degradation data for reliability evaluation, and the actual demand of using comprehensive evaluation methods to improve evaluation accuracy

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  • Bayesian reliability comprehensive estimation method based on multisource degraded data
  • Bayesian reliability comprehensive estimation method based on multisource degraded data
  • Bayesian reliability comprehensive estimation method based on multisource degraded data

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Embodiment

[0168] Taking a certain type of optoelectronic product as an example, through the evaluation of its step stress accelerated degradation test, the Bayesian reliability comprehensive evaluation method based on degradation data is introduced in detail.

[0169] Step 1. Collection of multi-source degradation data;

[0170] 1. Determine the performance degradation parameters that need to be collected;

[0171] Through the analysis, it is found that the failure of optical power degradation is the main failure cause of this product, and it is also used as the main performance index of the product in various tests, so the optical power is selected as the performance parameter that should be collected.

[0172] 2. Collect degradation information related to the determined degradation parameters during the development, production and use phases of the product;

[0173] After collection and analysis, it is considered that the performance parameter degradation data of this product in the ...

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Abstract

The invention discloses a Bayesian reliability comprehensive estimation method based on multisource degraded data, which comprises the following steps of: 1. collecting multisource degraded data; 2. establishing a degraded statistic model and confirming a reliability function; 3. preprocessing the degraded data; 4. confirming and fusing prior distribution and posterior distribution; and 5. estimating the reliability of a product. The invention provides a method for establishing the degraded statistic model, which converts a form of the degraded data by carrying out transformation processing on the performance degrading model of the product and leads the degraded data which is not submitted to probability distribution to submit to the probability distribution, thereby leading the Bayesian method for commonly processing life data to be capable of processing the degraded data and realizing the Bayesian statistic estimation based on the degraded data; accordingly, the Bayesian method is introduced into the estimation method of an degradation accelerating test, and the estimation method of the degradation accelerating test is expanded.

Description

technical field [0001] The invention relates to a reliability comprehensive evaluation method based on Bayesian theory for degradation data, and belongs to the technical field of reliability comprehensive evaluation. Background technique [0002] Usually, when evaluating the reliability of a product, the life data of the product is obtained through an accelerated life test, and the reliability of the product is evaluated by using the obtained life data. However, with the development of science and technology, long-life and high-reliability products are gradually becoming the mainstream today, so the characteristics of objects that need to be evaluated for reliability are also shifting to long-life and high reliability. Due to the long life and high reliability of the product, when evaluating the reliability of the product through the test, it is more and more difficult to obtain the life data, which causes certain difficulties to the evaluation. In view of this difficulty, ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G06F19/00
Inventor 王立志李晓阳孙富强姜同敏
Owner BEIHANG UNIV
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