Current fitting curve sudden change elimination method for liquid/liquid interface scanning electro-chemical microscope
A technology of scanning electrochemistry and curve fitting, which is applied in the field of liquid/liquid interface scanning electrochemical microscope current fitting curve jump elimination, can solve the problem of no jump elimination method for fitting current, and achieve the goal of eliminating signal jump Effect
Inactive Publication Date: 2010-12-08
NORTHWEST NORMAL UNIVERSITY
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However, there is no report on the jump elimination method for the jump problem of the fitting current generated when the standard distance value is large.
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Abstract
The invention relates to an elimination method of the jump of a current fitting curve by a scanning electrochemical microscope on a liquid / liquid interface, comprising the steps as follows: (1) a liquid / liquid interface is established; (2) the probe of the scanning electrochemical microscope extends into an organic phase containing reduction-state species and is close to the liquid / liquid interface; the distance d from the probe to the interface and the current value of the probe are recorded; furthermore, the relationship curve between the distance d and the current value of the probe is established; (3) the distance d is standardized as L and the standardized probe current I<T><k> is fit; (4) the relationship curve of fit standardized distance and standardized current is established; (5) discrete wavelet transformation is carried out to the signals (L is more than 2) so as to extract the similar and detailed components; and (6) a minimum average detail discrete wavelet transformation method is used for eliminating the fitting current jump which is generated when L is more than 2. The invention provides the minimum average detailed discrete wavelet transformation method by the discrete wavelet transformation method, which solves the fitting current jump problem of the standard current theory fitting curve of the liquid / liquid interface at large standard distance value.
Description
technical field The invention relates to a probe current of a scanning electrochemical microscope at a liquid / liquid interface, in particular to a method for eliminating a jump in a current fitting curve of a scanning electrochemical microscope at a liquid / liquid interface. Background technique Scanning electrochemical microscopy is often used to study complex liquid / liquid interface electron and ion transfer kinetics, and its application simplifies many complex electrochemical problems of liquid / liquid interface charge transfer. The feedback mode is the main quantitative operation mode of the scanning electrochemical microscope. In this mode, the probe used by the microscope is a disk electrode with a radius of α (usually 12.5 nm), and the probe current is directly driven by the electrons at the liquid / liquid interface. caused by transfer, so the probe current can be used to evaluate the oxidation state species (O 1 ) and reduced species (R in the organic phase (o) 2 ) B...
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Patent Type & Authority Patents(China)
IPC IPC(8): G01N13/24G12B21/00G01Q60/60
Inventor 卢小泉陈晶
Owner NORTHWEST NORMAL UNIVERSITY
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