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Device and method for dynamic measurement of surface topography of high-temperature molten metal

A metal surface, dynamic measurement technology, used in measurement devices, optical devices, instruments, etc., can solve problems such as metal object shape defects, improve measurement stability, improve lighting brightness, and ensure measurement accuracy.

Active Publication Date: 2021-08-03
SICHUAN UNIV
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Problems solved by technology

[0004] The purpose of the present invention is to overcome the problem that the morphological defect of the metal object (the object state is a high-temperature molten state) cannot be obtained in the laser processing process in the prior art, and to provide a dynamic measurement device and method for the surface morphology of the high-temperature molten state metal. It can intuitively obtain the shape, geometry, size and structural quality of the current state of the surface of the measured object during laser processing

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  • Device and method for dynamic measurement of surface topography of high-temperature molten metal
  • Device and method for dynamic measurement of surface topography of high-temperature molten metal
  • Device and method for dynamic measurement of surface topography of high-temperature molten metal

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Embodiment 1

[0041] figure 1A method for dynamically measuring the surface topography of a high-temperature molten metal according to an exemplary embodiment of the present invention is shown, which includes the following steps:

[0042] S1: Use the lighting projection system based on ultraviolet light source to project standard fringe images to the surface of the measured object, and obtain the modulated image on the surface of the measured object in real time;

[0043] S2: Perform three-dimensional Fourier transform on the modulated image, and perform filtering according to the fundamental frequency spectrum information corresponding to the modulated image to obtain the surface shape modulation spectrum of the object, and then obtain the modulated image through three-dimensional inverse Fourier transform truncated phase data of the image;

[0044] S3: Based on the truncated phase data of the modulated image, and based on the initial value state of the spatial phase unwrapping, use the c...

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Abstract

The invention discloses a dynamic measuring device and method for the surface topography of a high-temperature molten metal. Modulate the fundamental frequency spectrum information corresponding to the image, perform filtering to obtain the surface shape modulation spectrum of the object, and then obtain the truncated phase data of the modulated image through three-dimensional inverse Fourier transform; then, based on the truncated phase data of the modulated image, Use the continuity relationship of the phase on the time axis to carry out the phase expansion of the subsequent truncated phases to obtain the phase data of the measured object; finally, use the pre-established object phase-height mapping relationship to obtain the height data according to the phase data of the measured object, Obtain the point cloud data of the surface of the measured object. Therefore, the present invention can intuitively acquire the shape, geometry, size, and structural quality of the current state of the surface of the measured object during laser processing.

Description

technical field [0001] The invention belongs to the technical field of laser processing process detection, and in particular relates to a dynamic measurement device and method for the surface topography of high-temperature molten metal used in processes such as laser welding, laser cladding, and laser additive manufacturing. Background technique [0002] With the development of laser processing technology, especially the development of laser welding and additive and subtractive material manufacturing technology in recent years, the quality real-time detection technology of high-precision laser processing has been highly valued, especially in continuous processing and large-scale component manufacturing. Stability and control are key to its batch application. At present, there are CCD image detection (melt pool monitoring), infrared thermal imaging, X-ray and other technologies for the detection of laser thermal processing at home and abroad. Since 2018, the quality inspecti...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01B11/25
CPCG01B11/254
Inventor 王敏薛俊鹏张启灿李乾王齐明徐志超
Owner SICHUAN UNIV
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