Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Deformation measurement method and device

A measurement method and technology to be tested, applied in the field of metrology, can solve problems such as difficult to obtain material data, non-uniform stress state and microscopic appearance, and limited role in the research of mechanical-chemical coupling behavior, so as to achieve an objective and comprehensive disclosure of force-chemistry Coupling mechanism, easy operation effect

Active Publication Date: 2020-01-10
TSINGHUA UNIV
View PDF9 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, it should be pointed out that most of the above morphology methods are off-line detection methods, and it is often difficult to obtain the data of the material during the high temperature oxidation process. At the same time, for the oxidation behavior of the material, its stress state and microscopic morphology are often not uniform. , so the oxidation kinetics in different regions of the material are not completely consistent
Therefore, the above methods have limited effect on the study of mechanical-chemical coupling behavior.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Deformation measurement method and device
  • Deformation measurement method and device
  • Deformation measurement method and device

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0046] Various exemplary embodiments, features, and aspects of the present disclosure will be described in detail below with reference to the accompanying drawings. The same reference numbers in the figures indicate functionally identical or similar elements. While various aspects of the embodiments are shown in drawings, the drawings are not necessarily drawn to scale unless specifically indicated.

[0047] The word "exemplary" is used exclusively herein to mean "serving as an example, embodiment, or illustration." Any embodiment described herein as "exemplary" is not necessarily to be construed as superior or better than other embodiments.

[0048] In addition, in order to better illustrate the present disclosure, numerous specific details are given in the following specific implementation manners. It will be understood by those skilled in the art that the present disclosure may be practiced without some of the specific details. In some instances, methods, means, componen...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The present disclosure relates to a deformation measurement method and device. The method comprises the following steps: obtaining a first height field at a first moment and a second height field at asecond moment of a to-be-tested region on the surface of a to-be- tested member relative to a marker, respectively; and obtaining a first image at the first moment and a second image at the second moment of the to-be-tested region according to the first height field and the second height field, respectively. A force-chemical coupling mechanism is determined according to the first height field, the second height field, the first image and the second image. The deformation measurement method and device in the disclosure carry out analysis according to the characteristics of the height field onthe surface of the to-be-tested member; the operations are simple and easy. In addition, the present disclosure is capable of obtaining real-time data of the to-be-tested member during the process ofhigh-temperature oxidation, thereby obtaining the growth thickness of an oxide film of the to-be-tested member in different regions, which facilitates to investigate the oxidation kinetics process ofmaterials under different stress states and can reveal the force-chemical coupling mechanism more objectively and comprehensively.

Description

technical field [0001] The present disclosure relates to the field of metrology technology, in particular to a method and device for measuring deformation. Background technique [0002] With the development of aerospace, energy and power industries, high-temperature materials including nickel-based superalloys and niobium-based superalloys have been widely used. For example, the thermal efficiency of a steam turbine increases with the increase of operating temperature, so increasing its operating temperature becomes a feasible means to improve energy efficiency. At the same time, higher temperature puts forward higher requirements for high temperature resistance of materials. In order to improve thermal efficiency and ensure normal operation of equipment in engineering, a series of high-temperature structural materials are often used to replace conventional materials. Under working conditions, the above-mentioned high-temperature structural materials tend to undergo obviou...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): G01B11/16G01N3/18
CPCG01B11/16G01N3/18
Inventor 冯雪岳孟坤李燕方旭飞
Owner TSINGHUA UNIV
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products