Product life analysis method and terminal device

A technology of life analysis and product life, applied in design optimization/simulation, logistics, instruments, etc., can solve the problems that the analysis results are not scientific and accurate enough

Active Publication Date: 2018-07-13
NO 63908 TROOPS PLA
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0004] In view of this, the embodiment of the present invention provides a product life analysis method and terminal equipment to solve the problem that the analysis results in the prior art are not scientific and accurate enough

Method used

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  • Product life analysis method and terminal device
  • Product life analysis method and terminal device
  • Product life analysis method and terminal device

Examples

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Embodiment 1

[0074] figure 1 The implementation process of the product life analysis method provided by Embodiment 1 of the present invention is shown, and the details are as follows:

[0075] Step S101, obtaining the first test data of the product under the preset accelerated life test conditions, and the second test data of the product under the natural storage condition; the second test data is the corresponding time data when the product fails.

[0076] Step S102, converting the first test data into third test data under the natural storage conditions according to the preset accelerated life test conditions and the natural storage conditions.

[0077] Step S103, according to the second test data and the third test data, the life of the product is analyzed by the minimum chi-square estimation method.

[0078] As an implementable manner, the implementation process of step S102 is: according to the preset accelerated life test conditions and the natural storage conditions, the first test...

Embodiment 2

[0160] Corresponding to the product life analysis method described in the above examples, figure 2 A schematic diagram of the operating environment of the product life analysis program provided by the embodiment of the present invention is shown. For ease of description, only the parts related to this embodiment are shown.

[0161] In this embodiment, the product life analysis program 200 is installed and runs in the terminal device 20 . The terminal device 20 may include, but not limited to, a memory 201 and a processor 202 . figure 2 Only the terminal device 20 is shown with components 201-202, but it should be understood that implementing all of the illustrated components is not a requirement and that more or fewer components may instead be implemented.

[0162] The storage 201 may be an internal storage unit of the terminal device 20 in some embodiments, for example, a hard disk or a memory of the terminal device 20 . The memory 201 may also be an external storage dev...

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Abstract

The invention provides a product life analysis method and a terminal device. The method comprises the following steps: first test data of a product in preset accelerated life test conditions and second test data of the product in natural storage conditions are obtained, the second test data is corresponding time data when product failure occurs, the first test data is converted into third test data in the natural storage conditions according to the preset accelerated life test conditions and the natural storage conditions; according to the second test data and the third test data, product lifeis analyzed via a minimum chi-square estimation method. The above method and the terminal device can be used for scientifically and accurately analyzing and evaluating the product life.

Description

technical field [0001] The invention belongs to the technical field of life analysis, in particular to a product life analysis method and terminal equipment. Background technique [0002] Usually, after the product leaves the factory, it needs to be stored in the warehouse for a period of time for some reason, and the reliability index of the product will decrease due to the effect of the storage environment. In order to identify changes in product quality at different stages of storage, it is necessary to conduct tests and analyze test data during storage. [0003] Generally, the life analysis of the product can be carried out through the accelerated life test, but the accelerated life test of the product usually does not directly obtain the failure time of the product, so the product life test analysis based on the above test data is not scientific and accurate enough. Contents of the invention [0004] In view of this, the embodiment of the present invention provides a...

Claims

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Application Information

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IPC IPC(8): G06Q10/08G06F17/50
CPCG06Q10/087G06F30/20
Inventor 牛跃听赵晓东穆希辉葛强张国志宋桂飞马小兵柳维旗王韶光贾浩楠姜志保王永南黄琛
Owner NO 63908 TROOPS PLA
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