Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Reliability modeling method for related multi-mode system based on failure mechanism

A multi-state system and fault mechanism technology, applied in electrical digital data processing, special data processing applications, instruments, etc., can solve the problem that no scholar has proposed a fault mechanism unit or system multi-state characteristic reliability modeling method

Active Publication Date: 2017-03-15
BEIHANG UNIV
View PDF3 Cites 36 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] Through the search and novelty of existing technologies, no domestic scholars have proposed a reliability modeling method for failure mechanism correlation and multi-state characteristics of units or systems

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Reliability modeling method for related multi-mode system based on failure mechanism
  • Reliability modeling method for related multi-mode system based on failure mechanism
  • Reliability modeling method for related multi-mode system based on failure mechanism

Examples

Experimental program
Comparison scheme
Effect test

specific Embodiment

[0156] The following embodiments use the joint modeling method of improving the binary decision diagram and the multi-state multi-valued decision diagram to model the part of the circuit system in the multi-state optical system, and carry out Matlab simulation analysis to it, so as to embody the present invention Beneficial effect.

[0157] You can still refer to the attached image 3 As shown, the present invention is a multi-state system reliability modeling method based on fault mechanism correlation, and the specific implementation steps are as follows:

[0158] Step 1: Analyze the components of the system, and clearly define the various states of the system and its components. The system structure of the optical system is as attached Figure 16 shown. It mainly includes optical probe module and signal processing module, including 11 components in total. The name and description of each component are shown in Table 4.

[0159] Table 4 Detailed description of each comp...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention provides a reliability modeling method for a related multi-mode system based on a failure mechanism. The method comprises the following steps: analyzing system components and confirming and limiting various states of the system and the components; respectively confirming the failure mechanism of each component and the related relation of each failure mechanism under the working environments of the limited states and the function conditions, and establishing a binary decision graph model related to the failure mechanism for each component; calculating the state probability of each component according to the binary decision graph model established in the step (2) under the condition of the service life distribution of each known component under the independent effect of each failure mechanism and establishing a multi-mode multi-value decision graph model based on each component for the system according to the logic relation of each component in the system; substituting the state probability of each component acquired in the step (3) into the logic expressed by the multi-mode multi-value decision graph model established in the step (4) and calculating the state probability of the whole system and the system reliability.

Description

technical field [0001] The invention relates to the field of reliability modeling of multi-state systems, in particular to a multi-state system reliability modeling method based on failure mechanism correlation. Background technique [0002] The reliability model is a logic diagram representing the functional relationship between the units in the product. The logic diagram shows the logical relationship of how the failure of each unit or their combination leads to product failure. Reliability modeling is the premise of reliability work. Reliability distribution and prediction in the product scheme design stage, fault analysis and reliability evaluation in the manufacturing stage all require the establishment of reliability models. Reliability models include reliability block diagrams, fault trees, Petri nets, Bayesian nets, etc. Current research has extended these basic reliability models to dynamic and discrete fields. As a reliability modeling tool, binary decision diagr...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G06F17/50
CPCG06F30/20
Inventor 陈颖李颖异康锐
Owner BEIHANG UNIV
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com