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In-situ tensile sample for transmission electron microscope and preparation method of in-situ tensile sample

A technology of in-situ stretching and transmission electron microscopy, applied in the field of materials science, can solve problems such as low success rate and low technical efficiency, and achieve high success rate, wide application range and good stability

Active Publication Date: 2016-01-06
INNER MONGOLIA UNIV OF TECH
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0006] In order to overcome the shortcomings of the existing in-situ tensile sample preparation technology, such as low efficiency, low success rate, and difficulty in continuing to use to observe the structural information of the sample after tensile deformation, the present invention provides a method that can quickly prepare a relatively thin area In-situ tensile sample, the sample has, after in-situ stretching, the double-tilt table can be used to further study the deformation structure of the material after stretching

Method used

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  • In-situ tensile sample for transmission electron microscope and preparation method of in-situ tensile sample
  • In-situ tensile sample for transmission electron microscope and preparation method of in-situ tensile sample
  • In-situ tensile sample for transmission electron microscope and preparation method of in-situ tensile sample

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Embodiment Construction

[0032] 1. Prepare standard substrates for in-situ tensile specimens.

[0033] The base sheet 1 is produced by using the can skin, and a circular hole 4 with a diameter of 1.32 mm is opened on the top, and the sample is stretched in a fixed position to a fixed position on the sample stretching sample stage.

[0034] 2. Prepare a standard TEM sample 2. After double-jet electrolytic polishing, a hole 3 appears in the center of the sample, and the edge of the hole is the thin area observed in situ.

[0035] 3. Use the AB glue 5 to paste the standard TEM sample 2 on the two substrates 1 in a bridging manner (the gap between the two substrates is 1-2mm). AB glue 5 is evenly applied to the overlapping area between the standard electron microscope transmission sample 2 and the two standard substrates 1 , and then the sample 2 is placed on the two substrates 1 .

[0036] 4. After standing and curing the sample after the above step 3 for 2 hours, the in-situ tensile sample of the trans...

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Abstract

The invention discloses an in-situ tensile sample for a transmission electron microscope. The in-situ tensile sample comprises two standard substrates and a standard electron transmission sample body, wherein each standard substrate is a rectangular pop can sheet; a circular hole is formed in each pop can sheet; the standard electron transmission sample body is circular; a hole is formed in the center of the standard electron transmission sample body after the standard electron transmission sample body is subjected to twin-jet electropolishing; the standard electron transmission sample body is fixed on the two standard substrates symmetrically in a bridging manner.

Description

technical field [0001] The invention relates to the field of materials science, in particular, to the preparation of in-situ tensile samples in materials science. Background technique [0002] Transmission Electron Microscopy (TEM) is a large-scale instrument for analyzing the structure and morphology of materials, and its theoretical resolution has reached 0.1nm. It is one of the most powerful tools for analyzing the structure of materials at the nanoscale. The in-situ tensile test of the sample in the transmission electron microscope can dynamically observe the initiation and propagation of micro-cracks, and the in-situ observation and recording of the deformation process between the grains of the micro-region of the material is very important for explaining the deformation process and fracture mechanism of the material. significance. Both ends of the in-situ stretching sample require a substrate capable of fixing the sample and conducting the loading force, and the middl...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N1/28
Inventor 白朴存刘飞侯小虎崔晓明赵锦龙
Owner INNER MONGOLIA UNIV OF TECH
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