Analog circuit fuzzy group identification method

A technology for simulating circuits and identifying methods, applied in the directions of analog circuit testing, electronic circuit testing, etc., can solve problems such as the inability to get rid of transfer function dependencies, and achieve the effect of simple implementation methods

Inactive Publication Date: 2014-10-08
UNIV OF ELECTRONIC SCI & TECH OF CHINA
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  • Abstract
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  • Claims
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Problems solved by technology

[0011] The calculation of the symbolic analysis method is much easier than the transfer function, but the coefficient of the complex frequency s in the denominator of the test equation must be equal to 1, and still cannot get rid of the dependence on the transfer function

Method used

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  • Analog circuit fuzzy group identification method
  • Analog circuit fuzzy group identification method
  • Analog circuit fuzzy group identification method

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Embodiment

[0072] In order to illustrate the implementation process and effects of the present invention, an actual circuit is taken as an example for simulation verification. Image 6 It is a schematic diagram of the analog circuit in the embodiment. Such as Image 6 As shown, the analog circuit in this embodiment is a band-pass filter circuit, and the measuring point t is the node between the element R1 and the elements R2 and C1. First, perform a fault-free simulation on the circuit, and get the fault-free voltage at the measuring point t as Perform two fault simulations for each fault source in turn. Then, the characteristic parameters of the circle equation corresponding to each fault source are calculated according to the fault-free voltage and the fault voltage. Take the first fault source resistance R1 as an example. Its normal resistance value is 20kΩ. In the fault simulation of this embodiment, the resistance values ​​of the two fault simulations are set to 10kΩ and 40kΩ respec...

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Abstract

The invention discloses an analog circuit fuzzy group identification method. The general characteristic of the fault voltage of an analog circuit element is derived through a theory, wherein the characteristic is that a real part and an imaginary part meet an equation of a circle. According to the characteristic, the fuzzy group identification method is provided. The method includes the steps that fault-free simulation is conducted on each fault source firstly, so that a fault-free voltage value of each measuring point is obtained; simulation is conducted under two fault conditions, so that two fault voltage values are obtained; according to the three voltage values, an equation set of the circle is solved, so that circle characteristic parameters are obtained; the circle characteristic parameters corresponding to the fault sources are compared and the fault sources with the three same parameters are classified into a fuzzy group. According to the method, a transmission function is not needed, an achieving method is simple, a fuzzy group identification result is not related to a testing method, and the accuracy is the same as that of a transmission function and symbol analysis method.

Description

Technical field [0001] The invention belongs to the technical field of analog circuit fault diagnosis, and more specifically, relates to a method for identifying fuzzy groups of analog circuits. Background technique [0002] A fuzzy group is defined as a group of components, and there is no unique solution to the test equation of the tested analog circuit. In layman's terms, this group of components can produce the same output. Determining the fuzzy group information of the analog circuit is the primary task for the testability design and fault diagnosis of the analog circuit. The fuzzy group information is determined by the characteristics of the tested analog circuit and has nothing to do with the test method. At present, there are two main methods of fuzzy group recognition. One is to determine the fuzzy group information by QR decomposition of the test equations (transfer functions of different measuring points). This type of method is affected by the QR decomposition err...

Claims

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Application Information

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IPC IPC(8): G01R31/316
Inventor 杨成林田书林刘震龙兵周秀云
Owner UNIV OF ELECTRONIC SCI & TECH OF CHINA
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