Multi-reflecting time-of-flight mass spectrometer with isochronous curved ion interface
一种飞行时间质谱、飞行时间的技术,应用在质谱分析领域
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[0082] As highlighted above, multi-reflection plane time-of-flight analyzers are designed for high resolution and full mass range measurements. They are particularly attractive in combination with ion trap pulse converters. However, the resolution of planar MR TOF MS is mainly limited by ion implantation around the edge of the ion mirror. The second limiting factor is the phase space of the ion packets in the source, especially if an ion trap converter is used.
[0083] A prior art planar MR TOF MS is represented in Figure 1A. The planar MR TOF MS analyzer 11 includes two elongated planar gridless ion mirrors 12 and a periodic lens 14 . The ions travel between the mirrors along a jig-saw path reflected periodically by the mirrors 12 . The angle of incidence ("drift angle") of the ions to the mirror is typically about 1 degree. Lens 14 refocuses the ions and thus keeps them confined along a central path inclined by 1 degree. A small drift angle allows a substantial extensi...
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