155 M bit error code analysis tester based on field programmable gate array

A technology of gate array and tester, which is applied in the direction of digital transmission system, electrical components, transmission system, etc., to achieve the effect of improving reliability and simple circuit

Active Publication Date: 2008-08-06
WUHAN TELECOMM DEVICES
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] 1. Pseudo-random code sequence

Method used

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  • 155 M bit error code analysis tester based on field programmable gate array
  • 155 M bit error code analysis tester based on field programmable gate array
  • 155 M bit error code analysis tester based on field programmable gate array

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0071] Further description will be given below in conjunction with the accompanying drawings and embodiments.

[0072] 1. Selection of standard components

[0073] The device under test A refers to the photoelectric conversion module and system-level optical channels and electrical channels;

[0074] Clock data extraction and recovery chip B selects SY87700V;

[0075] Clock synthesis chip C chooses SY87739L;

[0076] SCM E chooses C8051F005;

[0077] The liquid crystal display screen and the error indicator light F use the 20464C of Jingdian Pengyuan;

[0078] Membrane keyboard G uses 3X3 keyboard connection;

[0079] Serial port communication interface H selects MAX3223E chip.

[0080] 2. Implementation of Field Programmable Gate Array Chip

[0081] Considering the working voltage, processing speed, price, supported interface types, capacity and power consumption of equivalent logic gates, the field programmable gate array chip D chooses Xilinx's Spartan IIE series XC2S...

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PUM

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Abstract

This invention discloses a 155M error analysis tester based on a site programmable gate array composed of a tested device, a clock data extraction and recover chip, a clock synthetic chip, a site programmable gate array chip, a single-chip processor, a liquid crystal display screen, a bit error pilot lamp, a film key board and a serial communication interface. The site programmable gate array includes a count module.

Description

technical field [0001] The invention relates to a code error analysis tester in the field of optical communication instrument and meter testing; in particular, it relates to a field programmable gate array chip, which realizes the sending, receiving and processing of pseudo-random code sequences through the field programmable gate array chip. Bit error detection and counting, so that it is convenient, fast and accurate to perform bit error analysis and testing. Background technique [0002] In the communication system, the bit error rate is a very important indicator. With the continuous development of communication technology, the transmission rate is getting higher and higher, and the rate of bit error testing is also increasing. At present, the price of foreign instruments with the same performance, such as Agilent 522A in the United States, is too high, and the test rate of the domestic Silicon Valley Communication SGT-1BS is generally below 2M, which cannot meet the cu...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): H04L12/26
Inventor 朱显新叶志农
Owner WUHAN TELECOMM DEVICES
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