Line loss rate benchmark value calculation method based on transformer area data feature classification
A technology of data characteristics and calculation methods, applied in the fields of calculation, complex mathematical operations, data processing applications, etc., can solve the problems of the complexity and accuracy of line loss calculation work, and achieve the accuracy of calculation results and the complexity of solving problems. Effect
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment Construction
[0051] The present invention can be realized through following specific technical routes:
[0052] Step 1: The theoretical line loss of the 0.4kV station area is mainly related to the resistance and current of the conductors in the station area. The influencing factors affecting the line loss rate of the 0.4kV station area may be divided into two categories, one is the parameters related to the actual operation, mainly including the daily average active power supply of the 0.4kV station area, daily load curve and annual load curve, operating voltage and Power factor, ambient temperature, etc. The first category is parameters related to grid structure and equipment, mainly including the number of trunk lines and down-line lines, line models, line lengths, line diameters, user distribution, user access methods, user meter etc. The relationship between each influencing factor and the line loss rate is shown in the following table:
[0053]
[0054] The second step: Based on ...
PUM
![No PUM](https://static-eureka-patsnap-com.libproxy1.nus.edu.sg/ssr/23.2.0/_nuxt/noPUMSmall.5c5f49c7.png)
Abstract
Description
Claims
Application Information
![application no application](https://static-eureka-patsnap-com.libproxy1.nus.edu.sg/ssr/23.2.0/_nuxt/application.06fe782c.png)
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com