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Silicon-on-insulator (SOI) low-resistance lateral high-voltage device and manufacturing method thereof

A technology of lateral high voltage and manufacturing method, which is applied in semiconductor/solid-state device manufacturing, semiconductor devices, electrical components, etc., can solve the problems of large specific on-resistance and limited application, and achieve lower specific on-resistance, good compatibility, Effect of device cost reduction

Inactive Publication Date: 2017-07-14
UNIV OF ELECTRONICS SCI & TECH OF CHINA +1
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, the low vertical withstand voltage of SOI lateral high-voltage devices limits its application in HVIC. According to the universal theory of SOI dielectric field enhancement (ENhanced DIelectric layer Field, ENDIF for short), the use of ultra-thin top-layer silicon can improve the longitudinal performance of SOI devices. withstand voltage, but it also leads to a larger specific on-resistance

Method used

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  • Silicon-on-insulator (SOI) low-resistance lateral high-voltage device and manufacturing method thereof
  • Silicon-on-insulator (SOI) low-resistance lateral high-voltage device and manufacturing method thereof
  • Silicon-on-insulator (SOI) low-resistance lateral high-voltage device and manufacturing method thereof

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Embodiment Construction

[0061] Embodiments of the present invention are described below through specific examples, and those skilled in the art can easily understand other advantages and effects of the present invention from the content disclosed in this specification. The present invention can also be implemented or applied through other different specific implementation modes, and various modifications or changes can be made to the details in this specification based on different viewpoints and applications without departing from the spirit of the present invention.

[0062] A method for manufacturing an SOI low-resistance lateral high-voltage device, comprising the following steps:

[0063] Step 1: Select SOI material, which includes Si substrate layer 1, buried oxide layer 2 and silicon-on-insulator layer;

[0064] Step 2: Perform two-stage linear variable doping of the drift region on the silicon-on-insulator layer, and form N-type linear variable doping thick SOI layer 4 and thin silicon layer ...

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Abstract

The invention provides a silicon-on-insulator (SOI) low-resistance lateral high-voltage device and a manufacturing method thereof. The manufacturing method comprises the following steps of taking an SOI as a substrate, forming an N-type linear variable doping thick SOI layer and a thin silicon layer drift region, forming a thin silicon layer region, namely a thick dielectric layer, and forming a Pwell region; and forming an Nwell region, forming a gate oxide layer, forming a poly-silicon gate electrode, forming an N strips, forming a P strip, performing injection of a first P-type heavy-doping region, a first N-type heavy-doping region and a second N-type heavy-doping region to form ohmic contact, etching a first-layer contact hole of a leading-out electrode, depositing aluminum metal, and forming a source contact electrode and a drain contact electrode. The manufacturing method is highly compatible with a traditional process and has universality; with the manufactured device, the device area can be effectively reduced, and the device cost is reduced; and in the SOI low-resistance lateral high-voltage device fabricated by the method, the formulas of BV=950V and R<on, sp>=153 ohms.cm<2> can be achieved.

Description

technical field [0001] The invention belongs to the technical field of semiconductor power devices, and in particular relates to an SOI low-resistance lateral high-voltage device and a manufacturing method thereof. Background technique [0002] Compared with conventional bulk silicon technology, SOI technology has the advantages of high speed, low power consumption, high integration, small parasitic effect, good isolation characteristics, small latch-up effect and strong radiation resistance, which makes the reliability and anti-software of integrated circuits The ability to make mistakes has been greatly improved, and it is gradually becoming the mainstream technology for manufacturing integrated circuits with high speed, low power consumption, high integration and high reliability. [0003] SOI high-voltage integrated circuits (High Voltage IC, HVIC for short) based on SOI lateral high-voltage devices, as a new branch in the field of smart power integrated circuits (Smart ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H01L21/316H01L21/265H01L29/06H01L29/36
CPCH01L21/02238H01L21/26506H01L29/0607H01L29/0684H01L29/36
Inventor 乔明詹珍雅章文通肖倩倩曾莉尧曹厚华丁柏浪张波
Owner UNIV OF ELECTRONICS SCI & TECH OF CHINA
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