Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Automatic testing device and method for optical transmitting and receiving chip

An automatic test device, optical transceiver technology, applied in the direction of electromagnetic wave transmission system, electrical components, transmission system, etc., can solve the problems of consuming a lot of manpower and time resources, errors, etc., and achieve the effect of accurate automatic testing and intuitive storage

Active Publication Date: 2017-07-07
XIAMEN UX HIGH SPEED IC
View PDF4 Cites 15 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

In the existing tests, most of them use manual testing. First, you need to manually input the control parameters, and manually import the test data configuration table, and then test the test items in turn and manually judge whether the test results meet the requirements. After the test is completed, manually record the test results. , when there are many chips to be tested, it takes a lot of manpower and time resources, and it is easy to cause errors during long-term testing

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Automatic testing device and method for optical transmitting and receiving chip
  • Automatic testing device and method for optical transmitting and receiving chip
  • Automatic testing device and method for optical transmitting and receiving chip

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0028] see figure 1 Shown, a kind of automatic testing device of optical transceiver chip is used for testing optical transceiver chip 7, and described optical transceiver chip 7 is a limiting amplifier (LA) and laser driver (LDD) integrated integrated chip, and described automatic testing device Including: host computer test module 1, USB to I2C module 2, MCU control module 3, relay switch 4, EEPROM module 5, regulated power supply module 6 and signal generator 8; the MCU control module 3 and the optical transceiver chip 7 is connected; the USB transfer I2C module 2 is connected between the host computer test module 1 and the MCU control module 3 for realizing communication between the USB bus of the host computer test module 1 and the I2C bus of the MCU control module 3; The host computer test module 1 is used to reset the test and the RAM test of the optical transceiver chip 7, and carry out data initialization and import test data configuration table to the optical transce...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses an automatic testing device and method for an optical transmitting and receiving chip. The device comprises an upper computer testing module, a USB-to-I2C module, a MCU control module, a relay switch, an EEPROM module, a stabilized voltage supply module and a signal generator; the MCU control module is connected with the optical transmitting and receiving chip; the USB-to-I2C module is connected between the upper computer testing module and the MCU control module; the upper computer testing module is used for controlling the relay switch to implement high and low level switching by the MCU control module, carrying out detection judgment on a register address, completing parameter testing and storing a testing result; the EEPROM module is connected with the optical transmitting and receiving chip and is used for importing data of EEPROM into the optical transmitting and receiving chip; and the stabilized voltage supply module is respectively connected with the optical transmitting and receiving chip and the relay switch and is used for providing a direct current power supply. According to the automatic testing device and method disclosed by the invention, by combining a hardware circuit with upper computer testing software, the optical transmitting and receiving chip can be rapidly and accurately subjected to automatic testing, and the testing result is stored.

Description

technical field [0001] The invention relates to the technical field of testing optical transceiver chips, in particular to an automatic testing device and method for optical transceiver chips. Background technique [0002] The optical module plays an indispensable role in optical communication. The optical transceiver chip is the integrated circuit in the optical transceiver module. It refers to the main basic chip of the physical layer of the optical fiber broadband network, including the transimpedance amplifier (TIA), limiting amplifier ( LA), laser driver (LDD) three. They are used in the front end of optical fiber transmission to realize the photoelectric and electro-optical conversion of high-speed transmission signals, and these functions are integrated in the optical fiber transceiver module. The optical transceiver chip is an important chip in the physical layer of the optical fiber broadband network, which is related to the transmission quality of the optical sign...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): H04B10/073
CPCH04B10/0731
Inventor 黄秋伟
Owner XIAMEN UX HIGH SPEED IC
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products