Method and device for evaluating reliability of circuit devices

A circuit device and reliability technology, applied in the field of reliability evaluation of circuit devices, can solve the problems of high R&D cost and long R&D cycle, achieve accurate reliability evaluation and reduce the effect of reliability test cycle

Active Publication Date: 2017-10-10
SHENZHEN STATE MICROELECTRONICS CO LTD
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  • Abstract
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  • Claims
  • Application Information

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Problems solved by technology

[0005] The purpose of the embodiments of the present invention is to provide a reliability evaluation method for circuit devices, which aims to solve the problems of long product development cycle and high development cost caused by the existing semiconductor device reliability evaluation method

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  • Method and device for evaluating reliability of circuit devices
  • Method and device for evaluating reliability of circuit devices
  • Method and device for evaluating reliability of circuit devices

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Embodiment Construction

[0025] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain the present invention, not to limit the present invention.

[0026] In the embodiment of the present invention, the "stress-characteristic parameter" trend model of the characteristic parameters of the circuit device is extracted, and the test circuit is modeled and stress simulated based on the circuit design simulation tool, and finally the Arrhenius empirical formula is used to complete the analysis in advance The reliability evaluation of the device can effectively reduce the reliability experiment cycle in the product development process, and can complete the reliability evaluation of the circuit device more accurately.

[0027] figure 1 The implementa...

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Abstract

The present invention is applicable to the technical field of reliability engineering, and provides a reliability evaluation method and device of a circuit device, including: configuring characteristic parameters of a test circuit used for reliability evaluation; obtaining stress trends of the characteristic parameters based on experimental data model, the stress trend model is used to represent the characteristic parameter values ​​of the characteristic parameters under different stresses; the circuit model of the test circuit is established; the stress trend model is introduced into the circuit model of the test circuit to obtain The stress simulation data of the test circuit; based on the stress simulation data of the test circuit, the Arrhenius empirical formula is used to complete the reliability evaluation of the test circuit. The invention effectively reduces the reliability experiment period in the product development process, and can accurately complete the reliability evaluation of circuit devices.

Description

technical field [0001] The invention belongs to the technical field of reliability engineering, in particular to a reliability evaluation method and device for circuit devices. Background technique [0002] The development of modern science and technology and the improvement of industrial level have greatly extended the life of semiconductor devices and improved the reliability of semiconductor devices. Therefore, how to evaluate the reliability of long-life and high-reliability products has become the current reliability engineering important issues to be addressed in the field. [0003] At present, the accelerated life test has become an effective method for predicting device reliability and is widely used in the industry. The failure of semiconductor devices is mostly caused by physical and chemical changes in the surface, body and metallization system. When the temperature rises, these changes are greatly accelerated, and the failure process of the device is accelerated...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G06F17/50
Inventor 李孝远林熠李洛宇罗春华安奇刘从振
Owner SHENZHEN STATE MICROELECTRONICS CO LTD
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